Inventor · disambiguated record
Douglas J. Cutter
Also filed as: CUTTER DOUGLAS J · CUTTER DOUGLAS JOHN · MA MANNY K
56 granted patents·3 pending applications·1,247 citations·filing 1995–2006
99Inventor score
Files withMICRON TECHNOLOGY INC49HEWLETT PACKARD CO3HEWLETT PACKARD DEVELOPMENT CO3CUTTER DOUGLAS J1RIEDLINGER REID J1
Top patents by PatentIndex Score
59 records- 0197US5847441ASemiconductor junction antifuse circuitMICRON TECHNOLOGY INC·Filed 1996·Granted Dec 8, 1998·157 cites·7 claims
- 0296US6365421B2Method and apparatus for storage of test results within an integrated circuitMICRON TECHNOLOGY INC·Filed 2000·Granted Apr 2, 2002·118 cites·41 claims
- 0395US5998069AElectrically programmable photolithography maskMICRON TECHNOLOGY INC·Filed 1998·Granted Dec 7, 1999·96 cites·25 claims
- 0494US6194738B1Method and apparatus for storage of test results within an integrated circuitMICRON TECHNOLOGY INC·Filed 1998·Granted Feb 27, 2001·102 cites·51 claims
- 0592US7590509B2System and method for testing a processorHEWLETT PACKARD DEVELOPMENT CO·Filed 2005·Granted Sep 15, 2009·23 cites·28 claims
- 0690US5631862ASelf current limiting antifuse circuitMICRON TECHNOLOGY INC·Filed 1996·Granted May 20, 1997·73 cites·18 claims
- 0788US8020038B2System and method for adjusting operating points of a processor based on detected processor errorsHEWLETT PACKARD DEVELOPMENT CO·Filed 2006·Granted Sep 13, 2011·21 cites·15 claims
- 0888US6525399B2Junctionless antifuses and systems containing junctionless antifusesMICRON TECHNOLOGY INC·Filed 2001·Granted Feb 25, 2003·36 cites·58 claims
- 0988US6456149B2Low current redundancy anti-fuse method and apparatusMICRON TECHNOLOGY INC·Filed 2001·Granted Sep 24, 2002·29 cites·61 claims
- 1088US5838625AAnti-fuse programming pathMICRON TECHNOLOGY INC·Filed 1996·Granted Nov 17, 1998·61 cites·29 claims
- 1183US5973380ASemiconductor junction antifuse circuitMICRON TECHNOLOGY INC·Filed 1998·Granted Oct 26, 1999·35 cites·7 claims
- 1280US6528217B2Electrically programmable photolithography maskMICRON TECHNOLOGY INC·Filed 2002·Granted Mar 4, 2003·13 cites·25 claims
- 1379US6687262B1Distributed MUX scheme for bi-endian rotator circuitHEWLETT PACKARD DEVELOPMENT CO·Filed 2000·Granted Feb 3, 2004·31 cites·16 claims
- 1479US6069064AMethod for forming a junctionless antifuseMICRON TECHNOLOGY INC·Filed 1996·Granted May 30, 2000·40 cites·13 claims
- 1577US5706238ASelf current limiting antifuse circuitMICRON TECHNOLOGY INC·Filed 1997·Granted Jan 6, 1998·36 cites·12 claims
- 1676US5877993AMemory circuit voltage regulatorMICRON TECHNOLOGY INC·Filed 1997·Granted Mar 2, 1999·16 cites·12 claims
- 1775US6446187B1Virtual address bypassing using local page maskHEWLETT PACKARD CO·Filed 2000·Granted Sep 3, 2002·27 cites·4 claims
- 1874US7054208B2Method and device for testing a sense ampMICRON TECHNOLOGY INC·Filed 2005·Granted May 30, 2006·3 cites·1 claims
- 1974US6335888B2Margin-range apparatus for a sense amp's voltage-pulling transistorMICRON TECHNOLOGY INC·Filed 2000·Granted Jan 1, 2002·8 cites·3 claims
- 2074US6154398ALow current redundancy anti-fuse method and apparatusMICRON TECHNOLOGY INC·Filed 1997·Granted Nov 28, 2000·20 cites·5 claims
- 2173US6185705B1Method and apparatus for checking the resistance of programmable elementsMICRON TECHNOLOGY INC·Filed 1997·Granted Feb 6, 2001·28 cites·27 claims
- 2273US5973978AAnti-fuse programming pathMICRON TECHNOLOGY INC·Filed 1998·Granted Oct 26, 1999·28 cites·23 claims
- 2373US5845315AMethod and apparatus for reducing the access time of a memory device by decoding a row address during a precharge period of the memory deviceMICRON TECHNOLOGY INC·Filed 1997·Granted Dec 1, 1998·28 cites·49 claims
- 2472US5847987ALow currency redundancy anti-fuse method and apparatusMICRON TECHNOLOGY INC·Filed 1997·Granted Dec 8, 1998·18 cites·6 claims
- 2571US6323536B1Method and apparatus for forming a junctionless antifuseMICRON TECHNOLOGY INC·Filed 1998·Granted Nov 27, 2001·28 cites·40 claims
- 2670US6255894B1Low current redundancy anti-fuse method and apparatusMICRON TECHNOLOGY INC·Filed 1999·Granted Jul 3, 2001·17 cites·16 claims
- 2769US6778452B2Circuit and method for voltage regulation in a semiconductor deviceMICRON TECHNOLOGY INC·Filed 2003·Granted Aug 17, 2004·6 cites·10 claims
- 2866US6444558B1Methods of forming and programming junctionless antifusesMICRON TECHNOLOGY INC·Filed 1998·Granted Sep 3, 2002·23 cites·45 claims
- 2965US6686790B2Low current redundancy anti-fuse method and apparatusMICRON TECHNOLOGY INC·Filed 2001·Granted Feb 3, 2004·8 cites·36 claims
- 3061US8423832B2System and method for preventing processor errorsRIEDLINGER REID J·Filed 2006·Granted Apr 16, 2013·5 cites·20 claims
- 3159US6487550B1Method and apparatus for finding a first elementHEWLETT PACKARD CO·Filed 2000·Granted Nov 26, 2002·6 cites·15 claims
- 3258US6052322AMemory circuit voltage regulatorMICRON TECHNOLOGY INC·Filed 1999·Granted Apr 18, 2000·6 cites·5 claims
- 3357US6379847B2Electrically programmable photolithography maskMICRON TECHNOLOGY INC·Filed 1999·Granted Apr 30, 2002·11 cites·26 claims
- 3455US6983404B2Method and apparatus for checking the resistance of programmable elementsMICRON TECHNOLOGY INC·Filed 2001·Granted Jan 3, 2006·7 cites·21 claims
- 3554US5625790AMethod and apparatus for reducing the access time of a memory device by decoding a row address during a precharge period of the memory deviceMICRON TECHNOLOGY INC·Filed 1995·Granted Apr 29, 1997·13 cites·9 claims
- 3653US6262927B1Current saturation test deviceMICRON TECHNOLOGY INC·Filed 2000·Granted Jul 17, 2001·2 cites·7 claims
- 3752US6181617B1Method and apparatus for testing a semiconductor deviceMICRON TECHNOLOGY INC·Filed 2000·Granted Jan 30, 2001·2 cites·4 claims
- 3851US6351140B2Low current redundancy anti-fuse method and apparatusMICRON TECHNOLOGY INC·Filed 2001·Granted Feb 26, 2002·3 cites·70 claims
- 3951US6128240ACancellation of redundant elements with a cancel bankMICRON TECHNOLOGY INC·Filed 1999·Granted Oct 3, 2000·8 cites·22 claims
- 4049US6154410AMethod and apparatus for reducing antifuse programming timeMICRON TECHNOLOGY INC·Filed 1997·Granted Nov 28, 2000·11 cites·12 claims
- 4149US5856950ACancellation of redundant elements with a cancel bankMICRON TECHNOLOGY INC·Filed 1997·Granted Jan 5, 1999·7 cites·14 claims
- 4246US5982656AMethod and apparatus for checking the resistance of programmable elementsMICRON TECHNOLOGY INC·Filed 1997·Granted Nov 9, 1999·10 cites·34 claims
- 4345US5991187AMethod for programming semiconductor junctions and for using the programming to control the operation of an integrated deviceMICRON TECHNOLOGY INC·Filed 1998·Granted Nov 23, 1999·5 cites·5 claims
- 4443US6537710B2Electrically programmable photolithography maskMICRON TECHNOLOGY INC·Filed 2002·Granted Mar 25, 2003·0 cites·25 claims
- 4543US6023431ALow current redundancy anti-fuse method and apparatusMICRON TECHNOLOGY INC·Filed 1996·Granted Feb 8, 2000·4 cites·17 claims
- 4643US2004083410A1Systems and methods to improve silicon debug of speed failures in memory arraysFiled 2002·Application pending·0 cites
- 4742US6462608B2Low current redundancy anti-fuse apparatusMICRON TECHNOLOGY INC·Filed 1997·Granted Oct 8, 2002·4 cites·104 claims
- 4841US6484238B1Apparatus and method for detecting snoop hits on victim lines issued to a higher level cacheHEWLETT PACKARD CO·Filed 1999·Granted Nov 19, 2002·12 cites·20 claims
- 4938US6452846B1Driver circuit for a voltage-pulling deviceMICRON TECHNOLOGY INC·Filed 2000·Granted Sep 17, 2002·0 cites·2 claims
- 5038US6445629B2Method of stressing a memory deviceMICRON TECHNOLOGY INC·Filed 2000·Granted Sep 3, 2002·0 cites·1 claims
Showing the top 50 of 59 patent records by PatentIndex Score.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →