Inventor · disambiguated record

Yotam Nissim Ben Shoshan

Also filed as: BEN SHOSHAN YOTAM NISSIM

1 granted patent·0 citations·filing 2023–2023

4Inventor score

Technology areasG06N

Files withAPPLIED MATERIALS ISRAEL LTD1

Top patents by PatentIndex Score

1 record

0151US12423800B2Machine learning based defect examination for semiconductor specimensAPPLIED MATERIALS ISRAEL LTD·Filed 2023·Granted Sep 23, 2025·0 cites·20 claims

Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →