Inventor · disambiguated record
Yehonatan Hai Ofir
Also filed as: OFIR YEHONATAN HAI
2 granted patents·0 citations·filing 2022–2023
22Inventor score
Files withAPPLIED MATERIALS ISRAEL LTD2
Top patents by PatentIndex Score
2 records- 0151US12423800B2Machine learning based defect examination for semiconductor specimensAPPLIED MATERIALS ISRAEL LTD·Filed 2023·Granted Sep 23, 2025·0 cites·20 claims
- 0248US12400319B2Defect examination on a semiconductor specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2022·Granted Aug 26, 2025·0 cites·18 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →