Inventor · disambiguated record
Zvi Nirel
Also filed as: NIREL ZVI
9 granted patents·209 citations·filing 1998–2014
89Inventor score
Top patents by PatentIndex Score
9 records- 0192US6166801AMonitoring apparatus and method particularly useful in photolithographically processing substratesNOVA MEASURING INSTR LTD·Filed 1998·Granted Dec 26, 2000·154 cites·20 claims
- 0290US7289190B2Monitoring apparatus and method particularly useful in photolithographicallyNOVA MEASURING INSTR LTD·Filed 2006·Granted Oct 30, 2007·9 cites·26 claims
- 0387US6842220B1Monitoring apparatus and method particularly useful in photolithographically processing substratesNOVA MEASURING INSTR LTD·Filed 2000·Granted Jan 11, 2005·24 cites·21 claims
- 0484US9291911B2Monitoring apparatus and method particularly useful in photolithographically processing substratesNOVA MEASURING INSTR LTD·Filed 2014·Granted Mar 22, 2016·3 cites·23 claims
- 0582US7525634B2Monitoring apparatus and method particularly useful in photolithographicallyNOVA MEASURING INSTR LTD·Filed 2007·Granted Apr 28, 2009·4 cites·26 claims
- 0679US7030957B2Monitoring apparatus and method particularly useful in photolithographically processing substratesNOVA MEASURING INSTR LTD·Filed 2004·Granted Apr 18, 2006·13 cites·44 claims
- 0773US8482715B2Monitoring apparatus and method particularly useful in photolithographically processing substratesDISHON GIORA·Filed 2010·Granted Jul 9, 2013·2 cites·20 claims
- 0861US8780320B2Monitoring apparatus and method particularly useful in photolithographically processing substratesNOVA MEASURING INSTR LTD·Filed 2013·Granted Jul 15, 2014·0 cites·26 claims
- 0961US7821614B2Monitoring apparatus and method particularly useful in photolithographically processing substratesNOVA MEASURING INSTR LTD·Filed 2009·Granted Oct 26, 2010·0 cites·19 claims
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