Inventor · disambiguated record
Tatsuya Ichinose
Also filed as: ICHINOSE TATSUYA
4 granted patents·4 pending applications·10 citations·filing 2015–2023
67Inventor score
Top patents by PatentIndex Score
8 records- 0188US10151727B2Automatic localized substrate analysis device and analysis methodIAS INC·Filed 2015·Granted Dec 11, 2018·6 cites·2 claims
- 0277US11569081B2Method for analyzing metal fine particles, and inductively coupled plasma mass spectrometry methodIAS INC·Filed 2019·Granted Jan 31, 2023·2 cites·1 claims
- 0376US10024801B2Analysis system for online-transferred analysis sampleIAS INC·Filed 2016·Granted Jul 17, 2018·2 cites·10 claims
- 0471US12354862B2Method for analyzing metal microparticles, and inductively coupled plasma mass spectrometry methodIAS INC·Filed 2022·Granted Jul 8, 2025·0 cites·2 claims
- 0559US2025377272A1Impurity acquisition system, quality inspection system, and liquid production and supply systemORGANO CORP·Filed 2023·Application pending·0 cites
- 0648US2025391648A1Method for quantitative analysis of elementsIAS INC·Filed 2022·Application pending·0 cites
- 0734US2019013248A1Nozzle for substrate analysisIAS INC·Filed 2016·Application pending·0 cites
- 0832US2018217036A1Silicon substrate analyzing deviceIAS INC·Filed 2016·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →