Inventor · disambiguated record
Young-Jee Yoon
Also filed as: YOON YOUNG-JEE
5 granted patents·3 pending applications·7 citations·filing 2005–2015
67Inventor score
Files withSAMSUNG ELECTRONICS CO LTD6
Top patents by PatentIndex Score
8 records- 0169US7747063B2Method and apparatus for inspecting a substrateSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Jun 29, 2010·4 cites·10 claims
- 0268US7697130B2Apparatus and method for inspecting a surface of a waferSAMSUNG ELECTRONICS CO LTD·Filed 2009·Granted Apr 13, 2010·3 cites·17 claims
- 0342US7626164B2Method of scanning a substrate, and method and apparatus for analyzing crystal characteristicsSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Dec 1, 2009·0 cites·19 claims
- 0441US2005151456A1Electron-beam inspection apparatus and methods of inspecting through-holes using clustered nanotube arraysFiled 2005·Application pending·0 cites
- 0540US7498248B2Methods of compensating for an alignment error during fabrication of structures on semiconductor substratesSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Mar 3, 2009·0 cites·15 claims
- 0640US2007030479A1Method of inspecting a defect on a substrateSAMSUNG ELECTRONICS CO LTD·Filed 2006·Application pending·0 cites
- 0739US9892983B2Apparatus for forming a thin layer and method of forming a thin layer on a substrate using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Feb 13, 2018·0 cites·20 claims
- 0835US2005191768A1Apparatus and method for measuring substratesFiled 2005·Application pending·0 cites
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