Inventor · disambiguated record
Keizo Kinoshita
Also filed as: KINOSHITA KEIZO
17 granted patents·1 pending application·125 citations·filing 1982–2019
91Inventor score
Top patents by PatentIndex Score
18 records- 0192US4397451AFurnace for the heat treatment of scale-covered steelCHUGAI RO KOGYO KAISHA LTD·Filed 1982·Granted Aug 9, 1983·31 cites·2 claims
- 0278US7585789B2Method for forming porous insulation filmASM JAPAN·Filed 2006·Granted Sep 8, 2009·6 cites·17 claims
- 0378US7439315B2Polymer film and method for producing the sameNEC CORP·Filed 2005·Granted Oct 21, 2008·4 cites·11 claims
- 0475US10340399B2Optical devicePHOTONICS ELECTRONICS TECHNOLOGY RES ASS·Filed 2016·Granted Jul 2, 2019·2 cites·4 claims
- 0573US5818040ANeutral particle beam irradiation apparatusNEC CORP·Filed 1996·Granted Oct 6, 1998·43 cites·8 claims
- 0671US7030028B2Etching methodNEC CORP·Filed 2001·Granted Apr 18, 2006·14 cites·15 claims
- 0769US11177623B2Optical device and method of manufacturing the sameFUJITSU LTD·Filed 2019·Granted Nov 16, 2021·1 cites·14 claims
- 0869US7220810B2Polymer film and method for producing the sameASM JAPAN·Filed 2005·Granted May 22, 2007·2 cites·6 claims
- 0967US10162110B2Semiconductor device and method for manufacturing the sameRENESAS ELECTRONICS CORP·Filed 2016·Granted Dec 25, 2018·1 cites·20 claims
- 1062US5356514AProcess and apparatus for etching iron-containing materialsNEC CORP·Filed 1991·Granted Oct 18, 1994·17 cites·4 claims
- 1152US10247882B2Optical waveguide circuit and method of fabricating sameNEC CORP·Filed 2017·Granted Apr 2, 2019·0 cites·18 claims
- 1248US2011092071A1Method of producing silylated porous insulating film, method of producing semiconductor device, and silylated materialRENESAS ELECTRONICS CORP·Filed 2009·Application pending·0 cites
- 1346US7524908B2Copolymerized high polymer film and method of manufacturing the sameNEC CORP·Filed 2005·Granted Apr 28, 2009·0 cites·10 claims
- 1444US10078182B2Semiconductor device and method for manufacturing the sameRENESAS ELECTRONICS CORP·Filed 2016·Granted Sep 18, 2018·0 cites·14 claims
- 1543US9406869B2Semiconductor deviceNEC CORP·Filed 2013·Granted Aug 2, 2016·0 cites·9 claims
- 1640US9985149B2Semiconductor device and method of manufacturing the sameRENESAS ELECTRONICS CORP·Filed 2016·Granted May 29, 2018·0 cites·9 claims
- 1737US8105661B2Method for forming porous insulation filmHYODO YASUYOSHI·Filed 2006·Granted Jan 31, 2012·0 cites·13 claims
- 1834US5744796AMass spectrometer and radical measuring methodNEC CORP·Filed 1996·Granted Apr 28, 1998·4 cites·3 claims
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