Inventor · disambiguated record
Hidehiro Kiyofuji
Also filed as: KIYOFUJI HIDEHIRO
12 granted patents·1 pending application·68 citations·filing 2005–2017
88Inventor score
Top patents by PatentIndex Score
13 records- 0190US7458818B2Electric connector and electrical connecting apparatus using the sameNIHON MICRONICS KK·Filed 2007·Granted Dec 2, 2008·27 cites·12 claims
- 0281US7586316B2Probe board mounting apparatusNIHON MICRONICS KK·Filed 2008·Granted Sep 8, 2009·12 cites·8 claims
- 0380US9400309B2Electric connecting apparatusNIHON MICRONICS KK·Filed 2014·Granted Jul 26, 2016·4 cites·7 claims
- 0476US7468610B2Electrical connecting apparatusNIHON MICRONICS KK·Filed 2007·Granted Dec 23, 2008·9 cites·6 claims
- 0574US10295590B2Probe card with temperature control function, inspection apparatus using the same, and inspection methodNIHON MICRONICS KK·Filed 2017·Granted May 21, 2019·1 cites·12 claims
- 0673US7667472B2Probe assembly, method of producing it and electrical connecting apparatusNIHON MICRONICS KK·Filed 2005·Granted Feb 23, 2010·7 cites·8 claims
- 0768US8680880B2Method and apparatus for testing integrated circuitKIYOFUJI HIDEHIRO·Filed 2009·Granted Mar 25, 2014·6 cites·20 claims
- 0863US9535090B2Electric connecting apparatusNIHON MICRONICS KK·Filed 2014·Granted Jan 3, 2017·1 cites·7 claims
- 0959US7525329B2Electrical connecting apparatusNIHON MICRONICS KK·Filed 2007·Granted Apr 28, 2009·1 cites·8 claims
- 1047US7843204B2Electrical connecting apparatusNIHON MICRONICS KK·Filed 2008·Granted Nov 30, 2010·0 cites·10 claims
- 1146US10705122B2Probe cardNIHON MICRONICS KK·Filed 2017·Granted Jul 7, 2020·0 cites·10 claims
- 1246US9341651B2Probe card and method for manufacturing the sameNIHON MICRONICS KK·Filed 2014·Granted May 17, 2016·0 cites·9 claims
- 1331US2007069748A1Probe assemblyKIYOFUJI HIDEHIRO·Filed 2006·Application pending·0 cites
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