Inventor · disambiguated record
Hiroshi Kanemura
Also filed as: KANEMURA HIROSHI
9 granted patents·3 pending applications·86 citations·filing 2012–2016
89Inventor score
Top patents by PatentIndex Score
12 records- 0194US9331156B2Semiconductor device and method for manufacturing the sameSEMICONDUCTOR ENERGY LAB·Filed 2012·Granted May 3, 2016·16 cites·20 claims
- 0294US9153649B2Semiconductor device and method for evaluating semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2013·Granted Oct 6, 2015·17 cites·11 claims
- 0393US8835921B2Oxide semiconductor film and semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2014·Granted Sep 16, 2014·11 cites·17 claims
- 0492US8686416B2Oxide semiconductor film and semiconductor deviceHONDA TATSUYA·Filed 2012·Granted Apr 1, 2014·11 cites·8 claims
- 0591US9196690B2Oxide semiconductor film and semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2014·Granted Nov 24, 2015·9 cites·20 claims
- 0690US10026847B2Semiconductor element, method for manufacturing semiconductor element, and semiconductor device including semiconductor elementSEMICONDUCTOR ENERGY LAB·Filed 2012·Granted Jul 17, 2018·8 cites·22 claims
- 0788US9825181B2Transistor, circuit, semiconductor device, display device, and electronic deviceSEMICONDUCTOR ENERGY LAB·Filed 2016·Granted Nov 21, 2017·6 cites·24 claims
- 0884US10153346B2Semiconductor device and method for manufacturing the sameSEMICONDUCTOR ENERGY LAB·Filed 2016·Granted Dec 11, 2018·3 cites·18 claims
- 0981US9341722B2Imaging deviceSEMICONDUCTOR ENERGY LAB·Filed 2014·Granted May 17, 2016·5 cites·14 claims
- 1048US2016027924A1Semiconductor Device and Method for Evaluating Semiconductor DeviceSEMICONDUCTOR ENERGY LAB·Filed 2015·Application pending·0 cites
- 1137US2017170325A1Oxide semiconductor film, semiconductor device, and display deviceSEMICONDUCTOR ENERGY LAB·Filed 2016·Application pending·0 cites
- 1234US2016155759A1Semiconductor device and display device including the sameSEMICONDUCTOR ENERGY LAB·Filed 2015·Application pending·0 cites
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