P

Inventor

JIN BEEN-YIH

US80 patents
⚠️ This page may combine multiple inventors who share the name “JIN BEEN-YIH”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

INTEL CORP

35 patents
US7485536B2Feb 3, 2009

Abrupt junction formation by atomic layer epitaxy of in situ delta doped dopant diffusion barriers

INTEL CORP155 citations99
US7348284B2Mar 25, 2008

Non-planar pMOS structure with a strained channel region and an integrated strained CMOS flow

INTEL CORP141 citations99
US7268058B2Sep 11, 2007

Tri-gate transistors and methods to fabricate same

INTEL CORP164 citations99
US7241653B2Jul 10, 2007

Nonplanar device with stress incorporation layer and method of fabrication

INTEL CORP125 citations99
US6974738B2Dec 13, 2005

Nonplanar device with stress incorporation layer and method of fabrication

INTEL CORP97 citations99
US6909151B2Jun 21, 2005

Nonplanar device with stress incorporation layer and method of fabrication

INTEL CORP241 citations99
US7745270B2Jun 29, 2010

Tri-gate patterning using dual layer gate stack

INTEL CORP121 citations98
US7531393B2May 12, 2009

Non-planar MOS structure with a strained channel region

INTEL CORP121 citations98
US7193279B2Mar 20, 2007

Non-planar MOS structure with a strained channel region

INTEL CORP76 citations98
US7727830B2Jun 1, 2010

Fabrication of germanium nanowire transistors

INTEL CORP58 citations97
US7569869B2Aug 4, 2009

Transistor having tensile strained channel and system including same

INTEL CORP59 citations97
US7821061B2Oct 26, 2010

Silicon germanium and germanium multigate and nanowire structures for logic and multilevel memory applications

INTEL CORP41 citations96
US7223679B2May 29, 2007

Transistor gate electrode having conductor material layer

INTEL CORP34 citations96
US6900481B2May 31, 2005

Non-silicon semiconductor and high-k gate dielectric metal oxide semiconductor field effect transistors

INTEL CORP64 citations96
US6825506B2Nov 30, 2004

Field effect transistor and method of fabrication

INTEL CORP72 citations96
US7968957B2Jun 28, 2011

Transistor gate electrode having conductor material layer

INTEL CORP11 citations93
US7902014B2Mar 8, 2011

CMOS devices with a single work function gate electrode and method of fabrication

INTEL CORP35 citations93
US7851790B2Dec 14, 2010

Isolated Germanium nanowire on Silicon fin

INTEL CORP43 citations93
US7825400B2Nov 2, 2010

Strain-inducing semiconductor regions

INTEL CORP14 citations93
US7767560B2Aug 3, 2010

Three dimensional strained quantum wells and three dimensional strained surface channels by Ge confinement method

INTEL CORP39 citations93
US7714397B2May 11, 2010

Tri-gate transistor device with stress incorporation layer and method of fabrication

INTEL CORP24 citations93
US7709312B2May 4, 2010

Methods for inducing strain in non-planar transistor structures

INTEL CORP34 citations93
US7592213B2Sep 22, 2009

Tensile strained NMOS transistor using group III-N source/drain regions

INTEL CORP22 citations93
US7960794B2Jun 14, 2011

Non-planar pMOS structure with a strained channel region and an integrated strained CMOS flow

INTEL CORP20 citations92
US7180109B2Feb 20, 2007

Field effect transistor and method of fabrication

INTEL CORP17 citations91
US7176075B2Feb 13, 2007

Field effect transistor and method of fabrication

INTEL CORP17 citations91
US9263557B2Feb 16, 2016

Techniques for forming non-planar germanium quantum well devices

INTEL CORP3 citations84
US7888221B2Feb 15, 2011

Tunneling field effect transistor using angled implants for forming asymmetric source/drain regions

INTEL CORP8 citations84
US7713803B2May 11, 2010

Mechanism for forming a remote delta doping layer of a quantum well structure

INTEL CORP12 citations84
US7638383B2Dec 29, 2009

Faceted catalytic dots for directed nanotube growth

INTEL CORP9 citations84
US7235809B2Jun 26, 2007

Semiconductor channel on insulator structure

INTEL CORP11 citations83
US7138316B2Nov 21, 2006

Semiconductor channel on insulator structure

INTEL CORP13 citations83
US7671414B2Mar 2, 2010

Semiconductor on insulator apparatus

INTEL CORP5 citations74
US7642610B2Jan 5, 2010

Transistor gate electrode having conductor material layer

INTEL CORP7 citations74
US7521775B2Apr 21, 2009

Protection of three dimensional transistor structures during gate stack etch

INTEL CORP7 citations74

DATTA SUMAN

3 patents

JIN BEEN-YIH

2 patents

DOYLE BRIAN S

2 patents

MACRONIX INT CO LTD

2 patents

PILLARISETTY RAVI

2 patents

KAVALIEROS JACK T

1 patent

HARELAND SCOTT A

1 patent

DATT DOT OVER A SUMAN

1 patent

MACRONIX INTERNATIONALCO LTD

1 patent

Showing the top 50 of 80 patents by PatentIndex Score.