Inventor · disambiguated record
Kenneth Gilbert Roessler
Also filed as: ROESSLER KENNETH · ROESSLER KENNETH G · ROESSLER KENNETH GILBERT
35 granted patents·2 pending applications·578 citations·filing 1992–2024
98Inventor score
Top patents by PatentIndex Score
37 records- 0197US8696818B2Debris removal in high aspect structuresRAVE LLC·Filed 2012·Granted Apr 15, 2014·32 cites·12 claims
- 0296US10384238B2Debris removal in high aspect structuresRAVE LLC·Filed 2016·Granted Aug 20, 2019·7 cites·8 claims
- 0396US10330581B2Debris removal from high aspect structuresRAVE LLC·Filed 2016·Granted Jun 25, 2019·11 cites·13 claims
- 0492US8287653B2Debris removal in high aspect structuresROBINSON TOD EVAN·Filed 2007·Granted Oct 16, 2012·17 cites·10 claims
- 0591US11391664B2Debris removal from high aspect structuresBRUKER NANO INC·Filed 2019·Granted Jul 19, 2022·3 cites·8 claims
- 0688US8182609B1Apparatus and method for direct surface cleaningLE CLAIRE JEFFREY E·Filed 2008·Granted May 22, 2012·30 cites·18 claims
- 0788US2024269717A1Debris removal from high aspect structuresBRUKER NANO INC·Filed 2024·Application pending·0 cites
- 0887US8613803B2Apparatus and method for indirect surface cleaningRAVE LLC·Filed 2012·Granted Dec 24, 2013·3 cites·20 claims
- 0986US11040379B2Debris removal in high aspect structuresBRUKER NANO INC·Filed 2019·Granted Jun 22, 2021·1 cites·13 claims
- 1084US11964310B2Debris removal from high aspect structuresBRUKER NANO INC·Filed 2023·Granted Apr 23, 2024·0 cites·15 claims
- 1184US8986460B2Apparatus and method for indirect surface cleaningRAVE LLC·Filed 2014·Granted Mar 24, 2015·2 cites·16 claims
- 1284US6169281B1Apparatus and method for determining side wall profiles using a scanning probe microscope having a probe dithered in lateral directionsIBM·Filed 1998·Granted Jan 2, 2001·85 cites·28 claims
- 1384US5262643AAutomatic tip approach method and apparatus for scanning probe microscopeIBM·Filed 1992·Granted Nov 16, 1993·60 cites·30 claims
- 1482US7993464B2Apparatus and method for indirect surface cleaningRAVE LLC·Filed 2008·Granted Aug 9, 2011·13 cites·43 claims
- 1581US6220084B1Detecting fields with a single-pass, dual-amplitude-mode scanning force microscopeIBM·Filed 2000·Granted Apr 24, 2001·26 cites·6 claims
- 1679US8562749B2Wafer fabrication processLECLAIRE JEFFREY E·Filed 2012·Granted Oct 22, 2013·4 cites·12 claims
- 1779US8293019B2Apparatus and method for indirect surface cleaningLECLAIRE JEFFREY E·Filed 2008·Granted Oct 23, 2012·3 cites·20 claims
- 1878US11577286B2Debris removal in high aspect structuresBRUKER NANO INC·Filed 2021·Granted Feb 14, 2023·0 cites·6 claims
- 1971US6079254AScanning force microscope with automatic surface engagement and improved amplitude demodulationIBM·Filed 1998·Granted Jun 27, 2000·46 cites·16 claims
- 2071US5902928AControlling engagement of a scanning microscope probe with a segmented piezoelectric actuatorIBM·Filed 1997·Granted May 11, 1999·41 cites·17 claims
- 2170US8741067B2Apparatus and method for indirect surface cleaningRAVE LLC·Filed 2013·Granted Jun 3, 2014·3 cites·15 claims
- 2270US6318159B1Scanning force microscope with automatic surface engagementIBM·Filed 2000·Granted Nov 20, 2001·22 cites·14 claims
- 2369US5918274ADetecting fields with a single-pass, dual-amplitude-mode scanning force microscopeIBM·Filed 1997·Granted Jun 29, 1999·30 cites·7 claims
- 2467US11311917B2Apparatus and method for contamination identificationBRUKER NANO INC·Filed 2017·Granted Apr 26, 2022·2 cites·13 claims
- 2566US5360974ADual quad flexure scannerIBM·Filed 1992·Granted Nov 1, 1994·27 cites·5 claims
- 2663US5801381AMethod for protecting a probe tip using active lateral scanning controlIBM·Filed 1997·Granted Sep 1, 1998·29 cites·17 claims
- 2763US5635848AMethod and system for controlling high-speed probe actuatorsIBM·Filed 1995·Granted Jun 3, 1997·24 cites·6 claims
- 2858US2014176922A1Debris Removal in High Aspect StructuresRAVE LLC·Filed 2014·Application pending·0 cites
- 2956US9588420B2Apparatus and method for indirect surface cleaningRAVE LLC·Filed 2016·Granted Mar 7, 2017·0 cites·15 claims
- 3056US7053369B1Scan data collection for better overall data accuracyRAVE LLC·Filed 2002·Granted May 30, 2006·7 cites·21 claims
- 3155US5260577ASample carriage for scanning probe microscopeIBM·Filed 1992·Granted Nov 9, 1993·11 cites·25 claims
- 3254US9285674B2Apparatus and method for indirect surface cleaningRAVE LLC·Filed 2015·Granted Mar 15, 2016·0 cites·20 claims
- 3354US5773824AMethod for improving measurement accuracy using active lateral scanning control of a probeIBM·Filed 1997·Granted Jun 30, 1998·20 cites·19 claims
- 3452US6167753B1Detecting fields with a single-pass, dual-amplitude-mode scanning force microscopeIBM·Filed 1999·Granted Jan 2, 2001·13 cites·14 claims
- 3548US6234009B1Controlling motion of a scanning force microscope probe tip moving into engagement with a sample surfaceIBM·Filed 2000·Granted May 22, 2001·6 cites·9 claims
- 3644US7547882B2Scan data collection for better overall data accurancyRAVE LLC·Filed 2006·Granted Jun 16, 2009·0 cites·17 claims
- 3737US7829360B2Vertical indent production repairRAVE LLC·Filed 2007·Granted Nov 9, 2010·0 cites·20 claims
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