Inventor · disambiguated record
Kyoung-Mo Yang
Also filed as: YANG KYOUNG-MO
5 granted patents·71 citations·filing 1997–2014
79Inventor score
Top patents by PatentIndex Score
5 records- 0186US6517412B2Method of controlling wafer polishing time using sample-skip algorithm and wafer polishing using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted Feb 11, 2003·40 cites·25 claims
- 0284US7989943B2Staircase shaped stacked semiconductor packageHYNIX SEMICONDUCTOR INC·Filed 2009·Granted Aug 2, 2011·15 cites·19 claims
- 0364US9397757B2Semiconductor packages with optical transceiversSK HYNIX INC·Filed 2014·Granted Jul 19, 2016·2 cites·9 claims
- 0443US5953579AIn-line test of contact opening of semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 1997·Granted Sep 14, 1999·11 cites·8 claims
- 0531US6048743AUsing a submicron level dimension referenceSAMSUNG ELECTRONICS CO LTD·Filed 1997·Granted Apr 11, 2000·3 cites·6 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →