Inventor · disambiguated record
Mark Anthony Mayse
Also filed as: MAYSE MARK · MAYSE MARK ANTHONY
10 granted patents·2 pending applications·198 citations·filing 2006–2012
92Inventor score
Top patents by PatentIndex Score
12 records- 0195US7659526B2Apparatus and method for controlled particle beam manufacturingNEXGEN SEMI HOLDING INC·Filed 2007·Granted Feb 9, 2010·26 cites·28 claims
- 0295US7501644B2Apparatus and method for controlled particle beam manufacturingNEXGEN SEMI HOLDING INC·Filed 2007·Granted Mar 10, 2009·24 cites·24 claims
- 0395US7259373B2Apparatus and method for controlled particle beam manufacturingNEXGENSEMI HOLDINGS CORP·Filed 2006·Granted Aug 21, 2007·53 cites·51 claims
- 0493US7507960B2Apparatus and method for controlled particle beam manufacturingNEXGEN SEMI HOLDING INC·Filed 2007·Granted Mar 24, 2009·15 cites·230 claims
- 0593US7495245B2Apparatus and method for controlled particle beam manufacturingNEXGEN SEMI HOLDING INC·Filed 2007·Granted Feb 24, 2009·15 cites·20 claims
- 0693US7495242B2Apparatus and method for controlled particle beam manufacturingNEXGEN SEMI HOLDING INC·Filed 2007·Granted Feb 24, 2009·15 cites·22 claims
- 0793US7488960B2Apparatus and method for controlled particle beam manufacturingNEXGEN SEMI HOLDING INC·Filed 2007·Granted Feb 10, 2009·17 cites·22 claims
- 0891US7993813B2Apparatus and method for conformal mask manufacturingNEXGEN SEMI HOLDING INC·Filed 2007·Granted Aug 9, 2011·14 cites·212 claims
- 0991US7495244B2Apparatus and method for controlled particle beam manufacturingNEXGEN SEMI HOLDING INC·Filed 2007·Granted Feb 24, 2009·12 cites·71 claims
- 1084US8278027B2Apparatus and method for conformal mask manufacturingSCOTT JEFFREY·Filed 2011·Granted Oct 2, 2012·7 cites·20 claims
- 1156US2010098922A1Apparatus and method for controlled particle beam manufacturingNEXGEN SEMI HOLDING INC·Filed 2009·Application pending·0 cites
- 1252US2013040458A1Apparatus and method for conformal mask manufacturingNEXGEN SEMI HOLDING INC·Filed 2012·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →