Inventor · disambiguated record
Michal Eilon
Also filed as: EILON MICHAL
5 granted patents·7 pending applications·12 citations·filing 2006–2024
70Inventor score
Files withAPPLIED MATERIALS ISRAEL LTD12
Top patents by PatentIndex Score
12 records- 0188US10217621B2Cleanliness monitor and a method for monitoring a cleanliness of a vacuum chamberAPPLIED MATERIALS ISRAEL LTD·Filed 2017·Granted Feb 26, 2019·8 cites·22 claims
- 0287US11049704B1Cleanliness monitor and a method for monitoring a cleanliness of a vacuum chamberAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted Jun 29, 2021·3 cites·15 claims
- 0382US12480898B2Z-profiling of wafers based on X-ray measurementsAPPLIED MATERIALS ISRAEL LTD·Filed 2022·Granted Nov 25, 2025·1 cites·20 claims
- 0462US2025216347A1Nondestructive estimation of structural properties of a specimen via x-ray modelling based on simulations and ground truth measurementsAPPLIED MATERIALS ISRAEL LTD·Filed 2024·Application pending·0 cites
- 0562US2025231132A1Nondestructive estimation of structural properties of a specimen via x-ray modelling based on ground truth measurementsAPPLIED MATERIALS ISRAEL LTD·Filed 2024·Application pending·0 cites
- 0661US2025130185A1Non-destructive three-dimensional probing and characterization of specimensAPPLIED MATERIALS ISRAEL LTD·Filed 2023·Application pending·0 cites
- 0758US2024255449A1Non-destructive classification of specimens based on energy signature measurementsAPPLIED MATERIALS ISRAEL LTD·Filed 2023·Application pending·0 cites
- 0856US2024096591A1Non-destructive sem-based depth-profiling of samplesAPPLIED MATERIALS ISRAEL LTD·Filed 2023·Application pending·0 cites
- 0954US2024085351A1Depth-profiling of samples based on x-ray measurementsAPPLIED MATERIALS ISRAEL LTD·Filed 2023·Application pending·0 cites
- 1054US2024094150A1Non-destructive sem-based depth-profiling of samplesAPPLIED MATERIALS ISRAEL LTD·Filed 2022·Application pending·0 cites
- 1148US10910204B2Cleanliness monitor and a method for monitoring a cleanliness of a vacuum chamberAPPLIED MATERIALS ISRAEL LTD·Filed 2019·Granted Feb 2, 2021·0 cites·20 claims
- 1232US8361814B2Method for monitoring chamber cleanlinessAPPLIED MATERIALS ISRAEL LTD·Filed 2006·Granted Jan 29, 2013·0 cites·17 claims
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