Inventor · disambiguated record
Tomoyuki Oishi
Also filed as: OISHI TOMOYUKI
8 granted patents·2 pending applications·5 citations·filing 2016–2024
75Inventor score
Top patents by PatentIndex Score
10 records- 0188US11244828B2Method for processing workpieceTOKYO ELECTRON LTD·Filed 2020·Granted Feb 8, 2022·2 cites·11 claims
- 0279US9859126B2Method for processing target objectTOKYO ELECTRON LTD·Filed 2016·Granted Jan 2, 2018·3 cites·15 claims
- 0365US11823903B2Method for processing workpieceTOKYO ELECTRON LTD·Filed 2021·Granted Nov 21, 2023·0 cites·18 claims
- 0462US2024369712A1Abnormality determination device, abnormality determination method, and non-transitory computer-readable storage medium storing abnormality determination programDENSO CORP·Filed 2024·Application pending·0 cites
- 0558US12300500B2Etching of polycrystalline semiconductorsTOKYO ELECTRON LTD·Filed 2022·Granted May 13, 2025·0 cites·21 claims
- 0658US2024221399A1Vehicle detection device, vehicle detection method, and non transitory computer-readable mediumDENSO CORP·Filed 2024·Application pending·0 cites
- 0757US12424000B2Object recognition system, object recognition method, and nontransitory computer-readable storage medium storing object recognition programDENSO CORP·Filed 2023·Granted Sep 23, 2025·0 cites·9 claims
- 0846US10714340B2Method for processing workpieceTOKYO ELECTRON LTD·Filed 2017·Granted Jul 14, 2020·0 cites·20 claims
- 0941US9721766B2Method for processing target objectTOKYO ELECTRON LTD·Filed 2016·Granted Aug 1, 2017·0 cites·11 claims
- 1038US9911622B2Method of processing target objectTOKYO ELECTRON LTD·Filed 2016·Granted Mar 6, 2018·0 cites·14 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →