Inventor · disambiguated record
Isao Yonekura
Also filed as: YONEKURA ISAO
4 granted patents·3 pending applications·15 citations·filing 2009–2014
69Inventor score
Top patents by PatentIndex Score
7 records- 0180US8604431B2Pattern-height measuring apparatus and pattern-height measuring methodMURAKAWA TSUTOMU·Filed 2012·Granted Dec 10, 2013·6 cites·12 claims
- 0277US9236218B2Defect inspection apparatus and method using a plurality of detectors to generate a subtracted image that may be used to form a subtraction profileADVANTEST CORP·Filed 2014·Granted Jan 12, 2016·3 cites·8 claims
- 0376US8779359B2Defect review apparatus and defect review methodOGISO YOSHIAKI·Filed 2011·Granted Jul 15, 2014·6 cites·14 claims
- 0444US2013264480A1Pattern measurement method and pattern measurement apparatusADVANTEST CORP·Filed 2013·Application pending·0 cites
- 0543US2014312224A1Pattern inspection method and pattern inspection apparatusADVANTEST CORP·Filed 2014·Application pending·0 cites
- 0640US8754935B2Microstructure inspection method, microstructure inspection apparatus, and microstructure inspection programYONEKURA ISAO·Filed 2009·Granted Jun 17, 2014·0 cites·10 claims
- 0739US2012318976A1Pattern measurement apparatus and pattern measurement methodMATSUMOTO JUN·Filed 2012·Application pending·0 cites
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