Inventor · disambiguated record
Hisae Yamamura
Also filed as: YAMAMURA HISAE
5 granted patents·213 citations·filing 1992–1999
85Inventor score
Files withHITACHI LTD4
Top patents by PatentIndex Score
5 records- 0185US5780866AMethod and apparatus for automatic focusing and a method and apparatus for three dimensional profile detectionHITACHI LTD·Filed 1995·Granted Jul 14, 1998·62 cites·26 claims
- 0275US6333992B1Defect judgement processing method and apparatusHITACHI LTD·Filed 1997·Granted Dec 25, 2001·47 cites·28 claims
- 0373US6622054B1Method monitoring a quality of electronic circuits and its manufacturing condition and system for itHITACHI LTD·Filed 1999·Granted Sep 16, 2003·36 cites·16 claims
- 0470US5373471ASemiconductor memory device having redundancy memory cells for replacing defectiveHITACHI LTD·Filed 1992·Granted Dec 13, 1994·31 cites·20 claims
- 0567US5459794AMethod and apparatus for measuring the size of a circuit or wiring pattern formed on a hybrid integrated circuit chip and a wiring board respectivelyFiled 1993·Granted Oct 17, 1995·37 cites·34 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →