Inventor · disambiguated record
Mark Klare
Also filed as: KLARE MARK
11 granted patents·5 pending applications·69 citations·filing 1996–2024
89Inventor score
Files withNOVA MEASURING INSTR INC10MICRON TECHNOLOGY INC3NOVA LTD1NOVA MEASURING INSTR LTD1REVERA INCORPORATED1
Top patents by PatentIndex Score
16 records- 0191US11029148B2Feed-forward of multi-layer and multi-process information using XPS and XRF technologiesNOVA MEASURING INSTR INC·Filed 2020·Granted Jun 8, 2021·2 cites·20 claims
- 0291US10533961B2Method and system for non-destructive metrology of thin layersNOVA MEASURING INSTR INC·Filed 2016·Granted Jan 14, 2020·5 cites·18 claims
- 0389US10648802B2Feed-forward of multi-layer and multi-process information using XPS and XRF technologiesNOVA MEASURING INSTR INC·Filed 2019·Granted May 12, 2020·2 cites·20 claims
- 0488US2025052704A1Method and system for non-destructive metrology of thin layersNOVA MEASURING INSTR INC·Filed 2024·Application pending·0 cites
- 0585US12066391B2Method and system for non-destructive metrology of thin layersNOVA MEASURING INSTR INC·Filed 2023·Granted Aug 20, 2024·0 cites·20 claims
- 0681US10082390B2Feed-forward of multi-layer and multi-process information using XPS and XRF technologiesREVERA INCORPORATED·Filed 2015·Granted Sep 25, 2018·2 cites·20 claims
- 0781US2024085174A1Feed-forward of multi-layer and multi-process information using xps and xrf technologiesNOVA MEASURING INSTR INC·Filed 2023·Application pending·0 cites
- 0877US11906451B2Method and system for non-destructive metrology of thin layersNOVA LTD·Filed 2021·Granted Feb 20, 2024·0 cites·20 claims
- 0975US5739064ASecond implanted matrix for agglomeration control and thermal stabilityMICRON TECHNOLOGY INC·Filed 1996·Granted Apr 14, 1998·31 cites·36 claims
- 1073US11733035B2Feed-forward of multi-layer and multi-process information using XPS and XRF technologiesNOVA MEASURING INSTR INC·Filed 2021·Granted Aug 22, 2023·0 cites·7 claims
- 1172US11668663B2Method and system for non-destructive metrology of thin layersNOVA MEASURING INSTR INC·Filed 2020·Granted Jun 6, 2023·0 cites·10 claims
- 1269US2019033069A1Feed-forward of multi-layer and multi-process information using xps and xrf technologiesNOVA MEASURING INSTR INC·Filed 2018·Application pending·0 cites
- 1365US5856698ASecond implanted matrix for agglomeration control and thermal stabilityMICRON TECHNOLOGY INC·Filed 1997·Granted Jan 5, 1999·19 cites·19 claims
- 1461US2018172609A1Method and system for non-destructive metrology of thin layersNOVA MEASURING INSTR LTD·Filed 2017·Application pending·0 cites
- 1559US2025067691A1Production solutions for high-throughput/precision xps metrology using unsupervised machine learningNOVA MEASURING INSTR INC·Filed 2022·Application pending·0 cites
- 1647US6100189ASecond implant for agglomeration controlMICRON TECHNOLOGY INC·Filed 1998·Granted Aug 8, 2000·8 cites·30 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →