Inventor · disambiguated record
Nian-Kai Zous
Also filed as: ZOUS NIAN-KAI
12 granted patents·267 citations·filing 2001–2009
91Inventor score
Top patents by PatentIndex Score
12 records- 0194US7187590B2Method and system for self-convergent erase in charge trapping memory cellsMACRONIX INT CO LTD·Filed 2004·Granted Mar 6, 2007·95 cites·74 claims
- 0294US6498377B1SONOS component having high dielectric propertyMACRONIX INT CO LTD·Filed 2002·Granted Dec 24, 2002·107 cites·18 claims
- 0382US6720614B2Operation method for programming and erasing a data in a P-channel sonos memory cellMACRONIX INT CO LTD·Filed 2001·Granted Apr 13, 2004·31 cites·12 claims
- 0464US7961513B2Method for programming a multilevel memoryMACRONIX INT CO LTD·Filed 2009·Granted Jun 14, 2011·4 cites·19 claims
- 0563US7596028B2Variable program and program verification methods for a virtual ground memory in easing buried drain contactsMACRONIX INT CO LTD·Filed 2006·Granted Sep 29, 2009·6 cites·20 claims
- 0662US7580292B2Method for programming a multilevel memoryMACRONIX INT CO LTD·Filed 2007·Granted Aug 25, 2009·4 cites·18 claims
- 0758US6445614B1Accelerated testing method and circuit for non-volatile memoryMACRONIX INT CO LTD·Filed 2001·Granted Sep 3, 2002·10 cites·4 claims
- 0854US6812099B2Method for fabricating non-volatile memory having P-type floating gateMACRONIX INT CO LTD·Filed 2002·Granted Nov 2, 2004·6 cites·20 claims
- 0948US8111547B2Multi-bit flash memory and reading method thereofLIN YUNG-FENG·Filed 2009·Granted Feb 7, 2012·1 cites·8 claims
- 1041US7643337B2Multi-bit flash memory and reading method thereofMACRONIX INT CO LTD·Filed 2007·Granted Jan 5, 2010·0 cites·14 claims
- 1137US6563752B2Qualification test method and circuit for a non-volatile memoryMACRONIX INT CO LTD·Filed 2001·Granted May 13, 2003·2 cites·5 claims
- 1236US6512710B1Reliability test method and circuit for non-volatile memoryMACRONIX INT CO LTD·Filed 2001·Granted Jan 28, 2003·1 cites·6 claims
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