Inventor · disambiguated record
Hwan-Wook Park
Also filed as: PARK HWAN WOOK
9 granted patents·1 pending application·48 citations·filing 2007–2019
85Inventor score
Top patents by PatentIndex Score
10 records- 0187US8325539B2Semiconductor memory device having physically shared data path and test device for the samePARK HWAN-WOOK·Filed 2010·Granted Dec 4, 2012·17 cites·23 claims
- 0274US7681097B2Test system employing test controller compressing data, data compressing circuit and test methodSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Mar 16, 2010·8 cites·9 claims
- 0371US7673209B2Test pattern generating circuit and semiconductor memory device having the sameSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Mar 2, 2010·8 cites·25 claims
- 0469US7692998B2Circuit of detecting power-up and power-downSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Apr 6, 2010·7 cites·24 claims
- 0561US7498847B2Output driver that operates both in a differential mode and in a single modeSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Mar 3, 2009·5 cites·20 claims
- 0657US10891988B2Memory modules and memory systems including a power management integrated circuitSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Jan 12, 2021·1 cites·20 claims
- 0755US10410686B2Memory modules storing a trimming control code associated with a minimum level of a power supply voltage, methods of operating the memory modules, and test systems of the memory modulesSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Sep 10, 2019·1 cites·20 claims
- 0846US8184680B2Data transceiver system and associated methodsPARK HWAN-WOOK·Filed 2009·Granted May 22, 2012·0 cites·20 claims
- 0944US7802154B2Method and apparatus for generating high-frequency command and address signals for high-speed semiconductor memory device testingSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Sep 21, 2010·1 cites·25 claims
- 1036US2012025861A1Test socket and test device having the samePARK HWAN WOOK·Filed 2011·Application pending·0 cites
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