Inventor · disambiguated record
John Laurence Niven
Also filed as: NIVEN JOHN · NIVEN JOHN LAURENCE
11 granted patents·1 pending application·215 citations·filing 2000–2009
91Inventor score
Top patents by PatentIndex Score
12 records- 0197US7565259B2System and method for reducing temperature variation during burn inSHENG ERIC CHEN-LI·Filed 2007·Granted Jul 21, 2009·66 cites·15 claims
- 0295US6900650B1System and method for controlling temperature during burn-inTRANSMETA CORP·Filed 2004·Granted May 31, 2005·70 cites·21 claims
- 0382US8607983B2Packaging systemNIVEN NORMAN·Filed 2008·Granted Dec 17, 2013·34 cites·10 claims
- 0482US7242205B1System and method for reducing heat dissipation during burn-inTRANSMETA CORP·Filed 2005·Granted Jul 10, 2007·9 cites·16 claims
- 0577US7834648B1Controlling temperature in a semiconductor deviceSHENG ERIC CHEN-LI·Filed 2008·Granted Nov 16, 2010·6 cites·18 claims
- 0675US6897671B1System and method for reducing heat dissipation during burn-inTRANSMETA CORP·Filed 2004·Granted May 24, 2005·14 cites·20 claims
- 0771US7248988B2System and method for reducing temperature variation during burn inTRANSMETA CORP·Filed 2004·Granted Jul 24, 2007·12 cites·29 claims
- 0852US7595652B2System and method for reducing heat dissipation during burn-inSHENG ERIC CHEN-LI·Filed 2007·Granted Sep 29, 2009·1 cites·10 claims
- 0952US7463050B1System and method for controlling temperature during burn-inTRANSMETA CORP·Filed 2005·Granted Dec 9, 2008·1 cites·21 claims
- 1047US8843344B2System and method for reducing temperature variation during burn inSHENG ERIC CHEN-LI·Filed 2009·Granted Sep 23, 2014·0 cites·20 claims
- 1147US2009316750A1System and method for reducing temperature variation during burn inSHENG ERIC CHEN-LI·Filed 2009·Application pending·0 cites
- 1237US6850075B1SRAM self-timed write stress test modeCYPRESS SEMICONDUCTOR CORP·Filed 2000·Granted Feb 1, 2005·2 cites·24 claims
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