Inventor · disambiguated record
Koenraad Van Ingen Schenau
Also filed as: VAN INGEN SCHENAU KOENRAAD
7 granted patents·2 pending applications·15 citations·filing 2018–2025
78Inventor score
Files withASML NETHERLANDS BV9
Top patents by PatentIndex Score
9 records- 0196US11079687B2Process window based on defect probabilityASML NETHERLANDS BV·Filed 2018·Granted Aug 3, 2021·11 cites·20 claims
- 0291US11768442B2Method of determining control parameters of a device manufacturing processASML NETHERLANDS BV·Filed 2022·Granted Sep 26, 2023·1 cites·20 claims
- 0385US2025355366A1Method for calibrating simulation process based on defect-based process windowASML NETHERLANDS BV·Filed 2025·Application pending·0 cites
- 0482US11513442B2Method of determining control parameters of a device manufacturing processASML NETHERLANDS BV·Filed 2018·Granted Nov 29, 2022·2 cites·20 claims
- 0581US2024126181A1Process window based on defect probabilityASML NETHERLANDS BV·Filed 2023·Application pending·0 cites
- 0680US12197136B2Method of determining control parameters of a device manufacturing processASML NETHERLANDS BV·Filed 2023·Granted Jan 14, 2025·0 cites·20 claims
- 0775US11822255B2Process window based on defect probabilityASML NETHERLANDS BV·Filed 2021·Granted Nov 21, 2023·0 cites·20 claims
- 0872US11733606B2Method for performing a manufacturing process and associated apparatusesASML NETHERLANDS BV·Filed 2019·Granted Aug 22, 2023·1 cites·20 claims
- 0967US12386268B2Method for calibrating simulation process based on defect-based process windowASML NETHERLANDS BV·Filed 2021·Granted Aug 12, 2025·0 cites·20 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →