Inventor · disambiguated record
Timothy J. Guiney
Also filed as: GUINEY TIMOTHY J
1 granted patent·2 pending applications·29 citations·filing 2004–2004
44Inventor score
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3 records- 0177US7323116B2Methods and apparatus for monitoring a process in a plasma processing system by measuring self-bias voltageLAM RES CORP·Filed 2004·Granted Jan 29, 2008·29 cites·32 claims
- 0233US2006065632A1Methods and apparatus for monitoring a process in a plasma processing system by measuring a plasma frequencyCHENG CHIA-CHENG·Filed 2004·Application pending·0 cites
- 0333US2006065631A1Methods and apparatus for monitoring a process in a plasma processing system by measuring impedanceCHENG CHIA-CHENG·Filed 2004·Application pending·0 cites
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