Inventor · disambiguated record

Gi-Woon Cha

Also filed as: CHA GI-WOON

1 granted patent·44 citations·filing 1995–1995

48Inventor score

Technology areasG11C

Files withSAMSUNG ELECTRONICS CO LTD1

Top patents by PatentIndex Score

1 record

0174US5638331ABurn-in test circuit and method in semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 1995·Granted Jun 10, 1997·44 cites·27 claims

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