Inventor · disambiguated record
Steven W. Mittl
Also filed as: MITTL STEVEN · MITTL STEVEN W
14 granted patents·2 pending applications·155 citations·filing 1995–2018
92Inventor score
Top patents by PatentIndex Score
16 records- 0190US9310424B2Monitoring aging of silicon in an integrated circuit deviceIBM·Filed 2013·Granted Apr 12, 2016·9 cites·18 claims
- 0289US8713490B1Managing aging of silicon in an integrated circuit deviceIBM·Filed 2013·Granted Apr 29, 2014·12 cites·25 claims
- 0386US6521977B1Deuterium reservoirs and ingress pathsIBM·Filed 2000·Granted Feb 18, 2003·30 cites·20 claims
- 0484US9978743B1Voltage balanced stacked clampIBM·Filed 2017·Granted May 22, 2018·3 cites·1 claims
- 0578US8587383B2Measuring bias temperature instability induced ring oscillator frequency degradationBROCHU JR DAVID G·Filed 2011·Granted Nov 19, 2013·6 cites·20 claims
- 0671US6770501B2Deuterium reservoirs and ingress pathsIBM·Filed 2002·Granted Aug 3, 2004·11 cites·17 claims
- 0768US6307250B1Electronic switch for decoupling capacitorIBM·Filed 1996·Granted Oct 23, 2001·26 cites·3 claims
- 0861US6252275B1Silicon-on-insulator non-volatile random access memory deviceIBM·Filed 1999·Granted Jun 26, 2001·20 cites·25 claims
- 0961US5982225AHot electron compensation for improved MOS transistor reliabilityIBM·Filed 1997·Granted Nov 9, 1999·18 cites·18 claims
- 1058US2018247931A1Voltage balanced stacked clampIBM·Filed 2018·Application pending·0 cites
- 1157US9310418B2Correction for stress induced leakage current in dielectric reliability evaluationsIBM·Filed 2014·Granted Apr 12, 2016·0 cites·22 claims
- 1255US2018247932A1Voltage balanced stacked clampIBM·Filed 2018·Application pending·0 cites
- 1354US10170460B2Voltage balanced stacked clampIBM·Filed 2017·Granted Jan 1, 2019·0 cites·7 claims
- 1445US5634001AMethod to calculate hot-electron test voltage differential for assessing microprocessor reliabilityIBM·Filed 1995·Granted May 27, 1997·20 cites·9 claims
- 1535US8937487B2Correction for stress induced leakage current in dielectric reliability evaluationsMITTL STEVEN W·Filed 2011·Granted Jan 20, 2015·0 cites·24 claims
- 1633US7123517B2Reprogrammable integrated circuit (IC) with overwritable nonvolatile storageIBM·Filed 2004·Granted Oct 17, 2006·0 cites·20 claims
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