Inventor · disambiguated record
Hideyoshi Takai
Also filed as: TAKAI HIDEYOSHI
3 granted patents·13 citations·filing 2007–2007
60Inventor score
Technology areasG11C
Files withTOSHIBA KK3
Top patents by PatentIndex Score
3 records- 0170US7558120B2Semiconductor integrated circuit device comprising MOS transistor having charge storage layer and method for testing semiconductor memory deviceTOSHIBA KK·Filed 2007·Granted Jul 7, 2009·11 cites·15 claims
- 0242US7694201B2Semiconductor testing device having test result sending back to generate second dataTOSHIBA KK·Filed 2007·Granted Apr 6, 2010·2 cites·20 claims
- 0332US7573765B2Semiconductor memory deviceTOSHIBA KK·Filed 2007·Granted Aug 11, 2009·0 cites·19 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →