Inventor · disambiguated record
Dana A. Marshall
Also filed as: MARSHALL DANA A
21 granted patents·4 pending applications·534 citations·filing 1994–2024
96Inventor score
Files withCUTTING EDGE OPTRONICS INC8BACTERIOSCAN LTD7IP SPECIALISTS LTD5PACTIV CORP2BACTERIOSCAN INC1
Top patents by PatentIndex Score
25 records- 0194US5734672ASmart laser diode array assembly and operating method using sameCUTTING EDGE OPTRONICS INC·Filed 1996·Granted Mar 31, 1998·109 cites·76 claims
- 0292US10040065B2Cuvette assembly having chambers for containing samples to be evaluated through optical measurementBACTERIOSCAN LTD·Filed 2017·Granted Aug 7, 2018·5 cites·20 claims
- 0392US6385226B2Smart laser diode array assemblyTRW INC·Filed 2001·Granted May 7, 2002·35 cites·20 claims
- 0492US5898211ALaser diode package with heat sinkCUTTING EDGE OPTRONICS INC·Filed 1996·Granted Apr 27, 1999·93 cites·49 claims
- 0591US9579648B2Cuvette assembly having chambers for containing samples to be evaluated through optical measurementBACTERIOSCAN INC·Filed 2014·Granted Feb 28, 2017·8 cites·26 claims
- 0690US10006857B2Laser-scatter measurement instrument having carousel-based fluid sample arrangementBACTERIOSCAN LTD·Filed 2016·Granted Jun 26, 2018·4 cites·12 claims
- 0787US12447468B2Cuvette assembly having chambers for containing samples to be evaluated through optical measurementIP SPECIALISTS LTD·Filed 2023·Granted Oct 21, 2025·0 cites·19 claims
- 0887US10668466B2Cuvette assembly having chambers for containing samples to be evaluated through optical measurementBACTERIOSCAN LTD·Filed 2018·Granted Jun 2, 2020·2 cites·24 claims
- 0986US10233481B2Multi-sample laser-scatter measurement instrument with incubation feature and systems for using the sameBACTERIOSCAN LTD·Filed 2015·Granted Mar 19, 2019·3 cites·9 claims
- 1086US5394427AHousing for a slab laser pumped by a close-coupled light sourceCUTTING EDGE OPTRONICS INC·Filed 1994·Granted Feb 28, 1995·71 cites·13 claims
- 1186US2024417772A1Laser-scatter measurement instrument for organism detection and related networkIP SPECIALISTS LTD·Filed 2024·Application pending·0 cites
- 1285US5985684AProcess for manufacturing a laser diode having a heat sinkCUTTING EDGE OPTRONICS INC·Filed 1999·Granted Nov 16, 1999·57 cites·23 claims
- 1381US6272164B1Smart laser diode array assemblyCUTTING EDGE OPTRONICS INC·Filed 2000·Granted Aug 7, 2001·13 cites·28 claims
- 1479US11268903B2Laser-scatter measurement instrument having carousel-based fluid sample arrangementIP SPECIALISTS LTD·Filed 2018·Granted Mar 8, 2022·1 cites·11 claims
- 1577US10065184B2Pipette having integrated filtration assemblyBACTERIOSCAN LTD·Filed 2015·Granted Sep 4, 2018·2 cites·17 claims
- 1675US6026109AHigh-power, solid-state laser in a cylindrical packageCUTTING EDGE OPTRONICS INC·Filed 1998·Granted Feb 15, 2000·51 cites·49 claims
- 1774US7750269B2Laser for forming bags from a web of materialPACTIV CORP·Filed 2007·Granted Jul 6, 2010·4 cites·33 claims
- 1874US7214173B2Laser for forming bags from a web of materialPACTIV CORP·Filed 2001·Granted May 8, 2007·18 cites·10 claims
- 1972US12077805B2Laser-scatter measurement instrument for organism detection and related networkIP SPECIALISTS LTD·Filed 2020·Granted Sep 3, 2024·0 cites·12 claims
- 2072US11801507B2Cuvette assembly having chambers for containing samples to be evaluated through optical measurementIP SPECIALISTS LTD·Filed 2020·Granted Oct 31, 2023·0 cites·23 claims
- 2170US6061378AMultiple resonant cavity solid-state laserCUTTING EDGE OPTRONICS INC·Filed 1997·Granted May 9, 2000·36 cites·57 claims
- 2267US6144684ASmart laser diode array assemblyCUTTING EDGE OPTRONICS INC·Filed 1998·Granted Nov 7, 2000·22 cites·34 claims
- 2358US2016161404A1System Using Laser-Scatter Measurement Instrument For Organism Identification And Related NetworkBACTERIOSCAN LTD·Filed 2015·Application pending·0 cites
- 2454US2019060891A1Pipette having integrated filtration assemblyBACTERIOSCAN LTD·Filed 2018·Application pending·0 cites
- 2547US2005055008A1Swabbable needleless vial accessFiled 2002·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →