Inventor · disambiguated record

Kai Kuparinen

Also filed as: KUPARINEN KAI

1 granted patent·43 citations·filing 2005–2005

47Inventor score

Technology areasG01N

Files withOXFORD INSTR ANALYTICAL OY1

Top patents by PatentIndex Score

1 record

0190US7233643B2Measurement apparatus and method for determining the material composition of a sample by combined X-ray fluorescence analysis and laser-induced breakdown spectroscopyOXFORD INSTR ANALYTICAL OY·Filed 2005·Granted Jun 19, 2007·43 cites·21 claims

Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →