Inventor · disambiguated record
Ronald J. Bolam
Also filed as: BOLAM RONALD J · BOLAM RONALD JAY
19 granted patents·1 pending application·221 citations·filing 1996–2013
95Inventor score
Top patents by PatentIndex Score
20 records- 0190US9310424B2Monitoring aging of silicon in an integrated circuit deviceIBM·Filed 2013·Granted Apr 12, 2016·9 cites·18 claims
- 0289US8713490B1Managing aging of silicon in an integrated circuit deviceIBM·Filed 2013·Granted Apr 29, 2014·12 cites·25 claims
- 0383US7298161B2Circuitry and methodology to establish correlation between gate dielectric test site reliability and product gate reliabilityIBM·Filed 2005·Granted Nov 20, 2007·10 cites·7 claims
- 0483US6879177B1Method and testing circuit for tracking transistor stress degradationIBM·Filed 2003·Granted Apr 12, 2005·27 cites·18 claims
- 0583US6133610ASilicon-on-insulator chip having an isolation barrier for reliability and process of manufactureIBM·Filed 1998·Granted Oct 17, 2000·57 cites·18 claims
- 0675US6563173B2Silicon-on-insulator chip having an isolation barrier for reliabilityIBM·Filed 2001·Granted May 13, 2003·17 cites·17 claims
- 0772US7890893B2Design structure for semiconductor on-chip repair scheme for negative bias temperature instabilityIBM·Filed 2008·Granted Feb 15, 2011·5 cites·19 claims
- 0872US7541829B1Method for correcting for asymmetry of threshold voltage shiftsIBM·Filed 2008·Granted Jun 2, 2009·6 cites·1 claims
- 0971US7838958B2Semiconductor on-chip repair scheme for negative bias temperature instabilityIBM·Filed 2008·Granted Nov 23, 2010·3 cites·7 claims
- 1068US7728372B2Method and structure for creation of a metal insulator metal capacitorIBM·Filed 2006·Granted Jun 1, 2010·3 cites·8 claims
- 1166US6492684B2Silicon-on-insulator chip having an isolation barrier for reliabilityIBM·Filed 2001·Granted Dec 10, 2002·11 cites·38 claims
- 1262US5804459AMethod for charge enhanced defect breakdown to improve yield and reliabilityIBM·Filed 1996·Granted Sep 8, 1998·29 cites·15 claims
- 1354US6281095B1Process of manufacturing silicon-on-insulator chip having an isolation barrier for reliabilityIBM·Filed 1998·Granted Aug 28, 2001·15 cites·10 claims
- 1449US6239469B1Method for fabrication of silicon on insulator substratesIBM·Filed 2000·Granted May 29, 2001·3 cites·3 claims
- 1548USRE40339ESilicon-on-insulator chip having an isolation barrier for reliabilityIBM·Filed 2004·Granted May 27, 2008·4 cites·75 claims
- 1643US6437594B1SOI pass gate leakage monitorIBM·Filed 2000·Granted Aug 20, 2002·2 cites·26 claims
- 1742US6891359B2Circuitry and methodology to establish correlation between gate dielectric test site reliability and product gate reliabilityIBM·Filed 2003·Granted May 10, 2005·1 cites·11 claims
- 1840US8227849B2Method and structure for creation of a metal insulator metal capacitorESHUN EBENEZER E·Filed 2010·Granted Jul 24, 2012·0 cites·10 claims
- 1939US6194253B1Method for fabrication of silicon on insulator substratesIBM·Filed 1998·Granted Feb 27, 2001·7 cites·16 claims
- 2038US2009063061A1Monitoring degradation of circiut speedIBM·Filed 2007·Application pending·0 cites
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