Inventor · disambiguated record
Takuya Hasumi
Also filed as: HASUMI TAKUYA
4 granted patents·10 citations·filing 2006–2008
64Inventor score
Top patents by PatentIndex Score
4 records- 0166US7714600B2Load fluctuation correction circuit, electronic device, testing device, and timing generating circuitADVANTEST CORP·Filed 2006·Granted May 11, 2010·6 cites·15 claims
- 0255US8058891B2Delay lock loop circuit, timing generator, semiconductor test device, semiconductor integrated circuit, and delay amount calibration methodHASUMI TAKUYA·Filed 2006·Granted Nov 15, 2011·4 cites·7 claims
- 0338US7755407B2Variable delay circuit, testing apparatus, and electronic deviceADVANTEST CORP·Filed 2008·Granted Jul 13, 2010·0 cites·10 claims
- 0436US7987062B2Delay circuit, test apparatus, storage medium semiconductor chip, initializing circuit and initializing methodADVANTEST CORP·Filed 2007·Granted Jul 26, 2011·0 cites·13 claims
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