Inventor · disambiguated record
Yosef Solt
Also filed as: SOLT YOSEF
24 granted patents·1 pending application·200 citations·filing 1996–2016
96Inventor score
Files withMARVELL ISRAEL MISL LTD11SOLT YOSEF6MARVELL SEMICONDUCTOR ISRAEL4GALILEO TECHNOLOGY LTD1MARVELL ISRAEL (M I S L) LTD1
Top patents by PatentIndex Score
25 records- 0192US7206988B1Error-correction memory architecture for testing production errorsMARVELL SEMICONDUCTOR ISRAEL·Filed 2005·Granted Apr 17, 2007·23 cites·1 claims
- 0290US7539915B1Integrated circuit testing using segmented scan chainsMARVELL ISRAEL MISL LTD·Filed 2003·Granted May 26, 2009·37 cites·18 claims
- 0389US8208326B1Method and apparatus for memory testSOLT YOSEF·Filed 2010·Granted Jun 26, 2012·20 cites·20 claims
- 0487US8572412B1Method and apparatus for warming up integrated circuitsSOLT YOSEF·Filed 2011·Granted Oct 29, 2013·9 cites·17 claims
- 0585US10031181B1Integrated circuit package receiving test pattern and corresponding signature patternMARVELL ISRAEL MISL LTD·Filed 2016·Granted Jul 24, 2018·3 cites·9 claims
- 0684US9726722B1Systems and methods for automatic test pattern generation for integrated circuit technologiesMARVELL ISRAEL (M I S L) LTD·Filed 2014·Granted Aug 8, 2017·5 cites·16 claims
- 0782US7949908B2Memory repair system and methodMARVELL ISRAEL MISL LTD·Filed 2007·Granted May 24, 2011·13 cites·64 claims
- 0879US8423839B2Memory repair system and methodYOEL RESHEF BAR·Filed 2011·Granted Apr 16, 2013·9 cites·20 claims
- 0975US6988237B1Error-correction memory architecture for testing production errorsMARVELL SEMICONDUCTOR ISRAEL·Filed 2004·Granted Jan 17, 2006·16 cites·24 claims
- 1071US9093127B1Method and apparatus for warming up integrated circuitsMARVELL ISRAEL MISL LTD·Filed 2013·Granted Jul 28, 2015·2 cites·18 claims
- 1170US8661223B1Buffer management architectureSOLT YOSEF·Filed 2012·Granted Feb 25, 2014·2 cites·20 claims
- 1267US8615688B2Method and system for iteratively testing and repairing an array of memory cellsMARVELL ISRAEL MISL LTD·Filed 2013·Granted Dec 24, 2013·3 cites·20 claims
- 1365US8176388B1System and method for soft error scrubbingMOSHE MICHAEL·Filed 2008·Granted May 8, 2012·9 cites·23 claims
- 1463US8829898B1Method and apparatus for testingSOLT YOSEF·Filed 2011·Granted Sep 9, 2014·2 cites·20 claims
- 1562US7478308B1Error-correction memory architecture for testing productionMARVELL ISRAEL MISL LTD·Filed 2007·Granted Jan 13, 2009·3 cites·25 claims
- 1661US8176291B1Buffer management architectureSOLT YOSEF·Filed 2010·Granted May 8, 2012·1 cites·12 claims
- 1761US7886207B1Integrated circuit testing using segmented scan chainsMARVELL ISRAEL MISL LTD·Filed 2009·Granted Feb 8, 2011·2 cites·20 claims
- 1857US7689793B1Buffer management architectureMARVELL ISRAEL MISL LTD·Filed 2004·Granted Mar 30, 2010·5 cites·44 claims
- 1951US8051348B1Integrated circuit testing using segmented scan chainsMARVELL ISRAEL MISL LTD·Filed 2010·Granted Nov 1, 2011·0 cites·20 claims
- 2051US7984358B1Error-correction memory architecture for testing production errorsMARVELL ISRAEL MISL LTD·Filed 2009·Granted Jul 19, 2011·1 cites·20 claims
- 2147US6829245B1Head of line blockingMARVELL SEMICONDUCTOR ISRAEL·Filed 1999·Granted Dec 7, 2004·18 cites·1 claims
- 2242US7730341B1System and method for transitioning from a logical state to any other logical state by modifying a single state elementMARVELL ISRAEL MISL LTD·Filed 2004·Granted Jun 1, 2010·2 cites·84 claims
- 2339US8526255B1Method and apparatus for memory testSOLT YOSEF·Filed 2012·Granted Sep 3, 2013·0 cites·20 claims
- 2436US2008195901A1Op-code based built-in-self-testMARVELL SEMICONDUCTOR ISRAEL·Filed 2008·Application pending·0 cites
- 2535US5790891ASynchronizing unit having two registers serially connected to one clocked elements and a latch unit for alternately activating the registers in accordance to clock signalsGALILEO TECHNOLOGY LTD·Filed 1996·Granted Aug 4, 1998·15 cites·8 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →