Inventor · disambiguated record
Klaus Enk
Also filed as: ENK KLAUS · ENK KLAUS G F
2 granted patents·36 citations·filing 1999–2001
55Inventor score
Technology areasG11C
Top patents by PatentIndex Score
2 records- 0172US6330697B1Apparatus and method for performing a defect leakage screen test for memory devicesIBM·Filed 1999·Granted Dec 11, 2001·36 cites·35 claims
- 0223US6693437B2Method and apparatus for identifying state-dependent, defect-related leakage currents in memory circuitsPROMOS TECHNOLOGIES INC·Filed 2001·Granted Feb 17, 2004·0 cites·5 claims
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