Inventor · disambiguated record
Alexander Mitwalsky
Also filed as: MITWALSKY ALEXANDER · MITWALSKY ALEXANDER R
12 granted patents·444 citations·filing 1995–2000
94Inventor score
Top patents by PatentIndex Score
12 records- 0186US6271578B1Crack stopsSIEMENS AG·Filed 1998·Granted Aug 7, 2001·60 cites·3 claims
- 0286US6025639ACrack stopsSIEMENS AG·Filed 1998·Granted Feb 15, 2000·60 cites·4 claims
- 0386US5789302ACrack stopsSIEMENS AG·Filed 1997·Granted Aug 4, 1998·60 cites·13 claims
- 0480US5843363AAblation patterning of multi-layered structuresSIEMENS AG·Filed 1995·Granted Dec 1, 1998·51 cites·14 claims
- 0575US6195300B1CBR refresh control for the redundancy arrayIBM·Filed 2000·Granted Feb 27, 2001·22 cites·17 claims
- 0673US6084287ACrack stopsSIEMENS AG·Filed 1998·Granted Jul 4, 2000·31 cites·1 claims
- 0769US5589706AFuse link structures through the addition of dummy structuresIBM·Filed 1995·Granted Dec 31, 1996·36 cites·8 claims
- 0867US5872390AFuse window with controlled fuse oxide thicknessIBM·Filed 1997·Granted Feb 16, 1999·35 cites·3 claims
- 0967US5609148AMethod and apparatus for dicing semiconductor wafersSIEMENS AG·Filed 1995·Granted Mar 11, 1997·27 cites·15 claims
- 1060US5766497AAblation pattering of multilayered structuresSIEMENS AG·Filed 1997·Granted Jun 16, 1998·20 cites·3 claims
- 1157US5776826ACrack stop formation for high-productivity processesIBM·Filed 1996·Granted Jul 7, 1998·22 cites·7 claims
- 1255US6376911B1Planarized final passivation for semiconductor devicesIBM·Filed 1995·Granted Apr 23, 2002·20 cites·5 claims
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