Inventor · disambiguated record
Blaine D. Johs
Also filed as: JOHS BLAINE D
102 granted patents·1 pending application·2,926 citations·filing 1992–2014
99Inventor score
Top patents by PatentIndex Score
103 records- 0198US7633625B1Spectroscopic ellipsometer and polarimeter systemsJ A WOOLLAM CO INC·Filed 2007·Granted Dec 15, 2009·115 cites·2 claims
- 0297US7907280B2Method of constructing a deviation angle self compensating substantially achromatic retarder to compensate beam traslationJ A WOOLLAM CO INC·Filed 2008·Granted Mar 15, 2011·94 cites·28 claims
- 0397US7460230B2Deviation angle self compensating substantially achromatic retarderJ A WOOLLAM CO INC·Filed 2006·Granted Dec 2, 2008·108 cites·21 claims
- 0497US7450231B2Deviation angle self compensating substantially achromatic retarderJ A WOOLLAM CO INC·Filed 2006·Granted Nov 11, 2008·105 cites·18 claims
- 0596US7616319B1Spectroscopic ellipsometer and polarimeter systemsJAMES D WELCH·Filed 2007·Granted Nov 10, 2009·117 cites·67 claims
- 0695US6937341B1System and method enabling simultaneous investigation of sample with two beams of electromagnetic radiationJ A WOOLLAM CO INC·Filed 2002·Granted Aug 30, 2005·96 cites·40 claims
- 0793US5373359AEllipsometerJ A WOOLLAM CO·Filed 1992·Granted Dec 13, 1994·141 cites·15 claims
- 0891US6982792B1Spectrophotometer, ellipsometer, polarimeter and the like systemsJ A WOOLLAM CO INC·Filed 2003·Granted Jan 3, 2006·49 cites·26 claims
- 0991US6456376B1Rotating compensator ellipsometer system with spatial filterJ A WOOLLAM CO INC·Filed 2001·Granted Sep 24, 2002·42 cites·37 claims
- 1091US5521706ASystem and method for compensating polarization-dependent sensitivity of dispersive optics in a rotating analyzer ellipsometer systemJ A WOOLLAM CO INC·Filed 1994·Granted May 28, 1996·107 cites·15 claims
- 1190US7492455B1Discrete polarization state spectroscopic ellipsometer system and method of useJ A WOOLLAM CO INC·Filed 2006·Granted Feb 17, 2009·22 cites·6 claims
- 1290US5872630ARegression calibrated spectroscopic rotating compensator ellipsometer system with photo array detectorFiled 1997·Granted Feb 16, 1999·126 cites·43 claims
- 1389US7505134B1Automated ellipsometer and the like systemsJ A WOOLLAM CO INC·Filed 2006·Granted Mar 17, 2009·15 cites·22 claims
- 1489US6353477B1Regression calibrated spectroscopic rotating compensator ellipsometer system with pseudo-achromatic retarder systemJ A WOOLLAM CO INC·Filed 2000·Granted Mar 5, 2002·39 cites·51 claims
- 1588US8248607B1Empirical correction for spectroscopic ellipsometric measurements of rough or textured surfacesHERZINGER CRAIG M·Filed 2010·Granted Aug 21, 2012·8 cites·14 claims
- 1688US7746471B1Flying mobile on-board ellipsometer, polarimeter, reflectometer and the like systemsJ A WOOLLAM CO INC·Filed 2007·Granted Jun 29, 2010·13 cites·32 claims
- 1788US5706212AInfrared ellipsometer/polarimeter system, method of calibration, and use thereofUNIV NEBRASKA·Filed 1996·Granted Jan 6, 1998·101 cites·29 claims
- 1887US7468794B1Rotating compensator ellipsometer system with spatial filter equivalentJ A WOOLLAM CO INC·Filed 2005·Granted Dec 23, 2008·12 cites·29 claims
- 1987US7277171B1Flying mobile on-board ellipsometer, polarimeter, reflectometer and the like systemsJ A WOOLLAN CO INC·Filed 2005·Granted Oct 2, 2007·18 cites·19 claims
- 2087US6822738B1Spectroscopic rotating compensator ellipsometer system with pseudo-achromatic retarder systemJ A WOOLLAM CO INC·Filed 2001·Granted Nov 23, 2004·34 cites·44 claims
- 2186US8339603B1Mapping ellipsometers and polarimeters comprising polarization state compensating beam directing means, and method of useLIPHARDT MARTIN M·Filed 2009·Granted Dec 25, 2012·10 cites·17 claims
- 2286US7336361B1Spectroscopic ellipsometer and polarimeter systemsJ A WOOLLAM CO INC·Filed 2005·Granted Feb 26, 2008·15 cites·26 claims
- 2386US6859278B1Multi-AOI-system for easy changing angles-of-incidence in ellipsometer, polarimeter and reflectometer systemsJ A WOOLLAM CO INC·Filed 2002·Granted Feb 22, 2005·29 cites·19 claims
- 2486US5666201AMultiple order dispersive optics system and method of useJ A WOOLLAM CO INC·Filed 1995·Granted Sep 9, 1997·95 cites·20 claims
- 2586US5504582ASystem and method for compensating polarization-dependent sensitivity of dispersive optics in a rotating analyzer ellipsometer systemJ A WOOLLAM CO INC·Filed 1994·Granted Apr 2, 1996·83 cites·20 claims
- 2685US5757494ASystem and method for improving data acquisition capability in spectroscopic ellipsometersJ A WOOLLAM CO INC·Filed 1995·Granted May 26, 1998·77 cites·31 claims
- 2784US6268917B1Combined polychromatic electromagnetic beam source system with application to ellipsometers, spectrophotometers and polarimetersJ A WOOLLAM CO INC·Filed 2000·Granted Jul 31, 2001·31 cites·18 claims
- 2884US5956145ASystem and method for improving data acquisition capability in spectroscopic rotatable element, rotating element, modulation element, and other ellipsometer and polarimeter and the like systemsJ A WOOLLAM CO INC·Filed 1998·Granted Sep 21, 1999·85 cites·21 claims
- 2983US7746472B1Automated ellipsometer and the like systemsJ A WOOLLAM CO INC·Filed 2008·Granted Jun 29, 2010·8 cites·29 claims
- 3083US7345762B1Control of beam spot size in ellipsometer and the like systemsJ A WOOLLAM CO INC·Filed 2005·Granted Mar 18, 2008·8 cites·21 claims
- 3183US7075650B1Discrete polarization state spectroscopic ellipsometer system and method of useJ A WOOLLAM CO INC·Filed 2003·Granted Jul 11, 2006·22 cites·28 claims
- 3283US5963327ATotal internal reflection electromagnetic radiation beam entry to, and exit from, ellipsometer, polarimeter, reflectometer and the like systemsJ A WOOLLAM CO INC·Filed 1998·Granted Oct 5, 1999·69 cites·19 claims
- 3383US5416588ASmall modulation ellipsometryUNIV NEBRASKA·Filed 1994·Granted May 16, 1995·66 cites·10 claims
- 3482US8248606B1Sample mapping in environmental chamberLIPHARDT MARTIN M·Filed 2009·Granted Aug 21, 2012·7 cites·11 claims
- 3582US7304737B1Rotating or rotatable compensator system providing aberation corrected electromagnetic raadiation to a spot on a sample at multiple angles of a incidenceJ A WOOLLAM CO INC·Filed 2006·Granted Dec 4, 2007·8 cites·17 claims
- 3682US7158231B1Spectroscopic ellipsometer and polarimeter systemsJ A WOOLLAM CO INC·Filed 2003·Granted Jan 2, 2007·26 cites·28 claims
- 3782US7075649B1Discrete polarization state rotatable compensator spectroscopic ellipsometer system, and method of calibrationJ A WOOLLAM CO·Filed 2001·Granted Jul 11, 2006·19 cites·21 claims
- 3882US6804004B1Multiple-element lens systems and methods for uncorrelated evaluation of parameters in parameterized mathematical model equations for lens retardance, in ellipometry and polarimetryJ A WOOLLAM CO INC·Filed 2000·Granted Oct 12, 2004·21 cites·30 claims
- 3982US6795184B1Odd bounce image rotation system in ellipsometer systemsJ A WOOLLAM CO INC·Filed 2001·Granted Sep 21, 2004·24 cites·10 claims
- 4081US8467057B1Ellipsometers and polarimeters comprising polarization state compensating beam directing sample wobble compensating system, and method of useJOHS BLAINE D·Filed 2011·Granted Jun 18, 2013·5 cites·19 claims
- 4181US7362435B1Method of determining initial thickness value for sample surface layer, and use of splines for fitting ellipsometric dataJ A WOOLLAM CO INC·Filed 2006·Granted Apr 22, 2008·7 cites·40 claims
- 4281US5936734AAnalysis of partially polarized electromagnetic radiation in ellipsometer and polarimeter systemsJ A WOOLLAM CO INC·Filed 1997·Granted Aug 10, 1999·56 cites·18 claims
- 4380US7705995B1Method of determining substrate etch depthJ A WOOLLAM CO INC·Filed 2005·Granted Apr 27, 2010·11 cites·12 claims
- 4480US7274450B1Sample entry purge system in spectrophotometer, ellipsometer, polarimeter and the like systemsJ A WOOLLAM CO INC·Filed 2004·Granted Sep 25, 2007·19 cites·9 claims
- 4580US5963325ADual vertically oriented triangular shaped optical retarder element for use in spectroscopic ellipsometer and polarimeter systemsJ A WOOLLAM CO INC·Filed 1999·Granted Oct 5, 1999·47 cites·9 claims
- 4679US7385697B2Sample analysis methodology utilizing electromagnetic radiationJ A WOOLLAM CO INC·Filed 2004·Granted Jun 10, 2008·19 cites·25 claims
- 4779US7245376B2Combined spatial filter and relay systems in rotating compensator ellipsometer/polarimeterJ A WOOLLAM CO INC·Filed 2005·Granted Jul 17, 2007·9 cites·33 claims
- 4879US7215424B1Broadband ellipsometer or polarimeter system including at least one multiple element lensJ A WOOLLAM CO INC·Filed 2005·Granted May 8, 2007·6 cites·23 claims
- 4978US7623237B1Sample investigating systemJ A WOOLLAM CO INC·Filed 2006·Granted Nov 24, 2009·5 cites·11 claims
- 5078US7136172B1System and method for setting and compensating errors in AOI and POI of a beam of EM radiationJ A WOOLLAM CO INC·Filed 2004·Granted Nov 14, 2006·15 cites·18 claims
Showing the top 50 of 103 patent records by PatentIndex Score.
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