Inventor · disambiguated record
Sadao Terakado
Also filed as: TERAKADO SADAO
6 granted patents·235 citations·filing 1992–1999
86Inventor score
Files withHITACHI LTD6
Top patents by PatentIndex Score
6 records- 0193US6114695AScanning electron microscope and method for dimension measuring by using the sameHITACHI LTD·Filed 1999·Granted Sep 5, 2000·62 cites·4 claims
- 0291US5594245AScanning electron microscope and method for dimension measuring by using the sameHITACHI LTD·Filed 1995·Granted Jan 14, 1997·71 cites·20 claims
- 0388US5969357AScanning electron microscope and method for dimension measuring by using the sameHITACHI LTD·Filed 1997·Granted Oct 19, 1999·43 cites·20 claims
- 0483US5866904AScanning electron microscope and method for dimension measuring by using the sameHITACHI LTD·Filed 1997·Granted Feb 2, 1999·42 cites·24 claims
- 0570USD381031SElectron microscopeHITACHI LTD·Filed 1995·Granted Jul 15, 1997·16 cites·1 claims
- 0630US5350918ATransmission electron microscopeHITACHI LTD·Filed 1992·Granted Sep 27, 1994·1 cites·8 claims
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