Inventor · disambiguated record
Akira Yahashi
Also filed as: YAHASHI AKIRA
9 granted patents·1 pending application·231 citations·filing 1994–2020
90Inventor score
Top patents by PatentIndex Score
10 records- 0190US6529280B1Three-dimensional measuring device and three-dimensional measuring methodMINOLTA CO LTD·Filed 2000·Granted Mar 4, 2003·45 cites·13 claims
- 0289US6141105AThree-dimensional measuring device and three-dimensional measuring methodMINOLTA CO LTD·Filed 1996·Granted Oct 31, 2000·73 cites·32 claims
- 0387US5760884ADistance measuring apparatus capable of measuring a distance depending on moving status of a moving objectMINOLTA CO LTD·Filed 1994·Granted Jun 2, 1998·36 cites·42 claims
- 0479US6853458B2Three-dimensional measuring method and device, and computer programMINOLTA CO LTD·Filed 2002·Granted Feb 8, 2005·23 cites·14 claims
- 0573US6614537B1Measuring apparatus and measuring methodMINOLTA CO LTD·Filed 2000·Granted Sep 2, 2003·19 cites·19 claims
- 0664US12236576B2Workpiece surface defect detection device and detection method, workpiece surface inspection system, and programKONICA MINOLTA INC·Filed 2019·Granted Feb 25, 2025·1 cites·24 claims
- 0762US6421114B1Three-dimensional information measuring apparatusMINOLTA CO LTD·Filed 2000·Granted Jul 16, 2002·18 cites·18 claims
- 0858US6297881B1Three-dimensional measurement method and three-dimensional measurement deviceMINOLTA CO LTD·Filed 2000·Granted Oct 2, 2001·8 cites·12 claims
- 0949US6847360B2Three-dimensional measuring method and systemMINOLTA CO LTD·Filed 2002·Granted Jan 25, 2005·8 cites·9 claims
- 1043US2022292665A1Workpiece surface defect detection device and detection method, workpiece surface inspection system, and programKONICA MINOLTA INC·Filed 2020·Application pending·0 cites
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