Inventor · disambiguated record
Christopher Neville
Also filed as: NEVILLE CHRISTOPHER · NEVILLE CHRISTOPHER L
8 granted patents·1 pending application·120 citations·filing 1993–2009
87Inventor score
Top patents by PatentIndex Score
9 records- 0183US5627624AIntegrated circuit test reticle and alignment mark optimization methodLSI LOGIC CORP·Filed 1994·Granted May 6, 1997·40 cites·21 claims
- 0282US7541216B2Method of aligning deposited nanotubes onto an etched feature using a spacerNANTERO INC·Filed 2005·Granted Jun 2, 2009·11 cites·14 claims
- 0373US7313508B2Process window compliant corrections of design layoutLSI CORP·Filed 2002·Granted Dec 25, 2007·13 cites·25 claims
- 0472US5329334AIntegrated circuit test reticle and alignment mark optimization methodLSI LOGIC CORP·Filed 1993·Granted Jul 12, 1994·26 cites·22 claims
- 0565US5898478AMethod of using a test reticle to optimize alignment of integrated circuit process layersLSI LOGIC CORP·Filed 1997·Granted Apr 27, 1999·23 cites·8 claims
- 0664US7858979B2Method of aligning deposited nanotubes onto an etched feature using a spacerNANTERO INC·Filed 2009·Granted Dec 28, 2010·2 cites·12 claims
- 0739US7001695B2Multiple alternating phase shift technology for amplifying resolutionLSI LOGIC CORP·Filed 2003·Granted Feb 21, 2006·0 cites·10 claims
- 0839US2005151949A1Process and apparatus for applying apodization to maskless optical direct write lithography processesLSI LOGIC CORP·Filed 2004·Application pending·0 cites
- 0937US6426131B1Off-axis pupil aperture and method for making the sameLSI LOGIC CORP·Filed 1999·Granted Jul 30, 2002·5 cites·28 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →