Inventor · disambiguated record
Joe Ko
Also filed as: KO JOE
41 granted patents·2 pending applications·1,336 citations·filing 1991–2002
98Inventor score
Top patents by PatentIndex Score
43 records- 0195US5576557AComplementary LVTSCR ESD protection circuit for sub-micron CMOS integrated circuitsUNITED MICROELECTRONICS CORP·Filed 1995·Granted Nov 19, 1996·154 cites·14 claims
- 0291US6271082B1Method of fabricating a mixed circuit capacitorUNITED MICROELECTRONICS CORP·Filed 2000·Granted Aug 7, 2001·74 cites·20 claims
- 0391US5393701ALayout design to eliminate process antenna effectUNITED MICROELECTRONICS CORP·Filed 1993·Granted Feb 28, 1995·129 cites·11 claims
- 0490US5559352AESD protection improvementUNITED MICROELECTRONICS CORP·Filed 1994·Granted Sep 24, 1996·70 cites·8 claims
- 0590US5350710ADevice for preventing antenna effect on circuitUNITED MICROELECTRONICS CORP·Filed 1993·Granted Sep 27, 1994·118 cites·18 claims
- 0687US5821629ABuried structure SRAM cell and methods for fabricationUNITED MICROELECTRONICS CORP·Filed 1995·Granted Oct 13, 1998·78 cites·4 claims
- 0787US5473169AComplementary-SCR electrostatic discharge protection circuitUNITED MICROELECTRONICS CORP·Filed 1995·Granted Dec 5, 1995·78 cites·3 claims
- 0882US5140401ACMOS ESD protection circuit with parasitic SCR structuresUNITED MICROELECTRONICS CORP·Filed 1991·Granted Aug 18, 1992·57 cites·17 claims
- 0981US6207535B1Method of forming shallow trench isolationUNITED MICROELECTRONICS CORP·Filed 2000·Granted Mar 27, 2001·35 cites·22 claims
- 1080US5374565AMethod for ESD protection improvementUNITED MICROELECTRONICS CORP·Filed 1993·Granted Dec 20, 1994·40 cites·6 claims
- 1176US5308780ASurface counter-doped N-LDD for high hot carrier reliabilityUNITED MICROELECTRONICS CORP·Filed 1993·Granted May 3, 1994·52 cites·19 claims
- 1273US5460987AMethod of making field effect transistor structure of a diving channel deviceUNITED MICROELECTRONICS CORP·Filed 1994·Granted Oct 24, 1995·29 cites·13 claims
- 1372US5956590AProcess of forming a field effect transistor without spacer mask edge defectsUNITED MICROELECTRONICS CORP·Filed 1997·Granted Sep 21, 1999·42 cites·24 claims
- 1472US5393693A"Bird-beak-less" field isolation methodUNITED MICROELECTRONICS CORP·Filed 1994·Granted Feb 28, 1995·45 cites·19 claims
- 1571US5565700ASurface counter doped N-LDD for high carrier reliabilityUNITED MICROELECTRONICS CORP·Filed 1995·Granted Oct 15, 1996·34 cites·11 claims
- 1665US5565369AMethod of making retarded DDD (double diffused drain) device structureUNITED MICROELECTRONICS CORP·Filed 1995·Granted Oct 15, 1996·21 cites·19 claims
- 1764US6303455B1Method for manufacturing capacitorUNITED MICROELECTRONICS CORP·Filed 2000·Granted Oct 16, 2001·13 cites·15 claims
- 1864US5686321ALocal punchthrough stop for ultra large scale integration devicesUNITED MICROELECTRONICS CORP·Filed 1996·Granted Nov 11, 1997·22 cites·13 claims
- 1963US5574302AField effect transistor structure of a diving channel deviceUNITED MICROELECTRONICS CORP·Filed 1995·Granted Nov 12, 1996·19 cites·13 claims
- 2062US6350677B1Method for forming a self-aligned silicide layerUNITED MICROELECTRONICS CORP·Filed 2000·Granted Feb 26, 2002·10 cites·19 claims
- 2161US5484743ASelf-aligned anti-punchthrough implantation processUNITED MICROELECTRONICS CORP·Filed 1995·Granted Jan 16, 1996·21 cites·17 claims
- 2258US5518941AMaskless method for formation of a field implant channel stop regionUNITED MICROELECTRONICS CORP·Filed 1994·Granted May 21, 1996·27 cites·18 claims
- 2357US5514623AMethod of making layout design to eliminate process antenna effectUNITED MICROELECTRONICS CORP·Filed 1995·Granted May 7, 1996·20 cites·8 claims
- 2454US6309925B1Method for manufacturing capacitorUNITED MICROELECTRONICS CORP·Filed 2000·Granted Oct 30, 2001·7 cites·12 claims
- 2553US5434108AGrounding method to eliminate the antenna effect in VLSI processUNITED MICROELECTRONICS CORP·Filed 1993·Granted Jul 18, 1995·21 cites·11 claims
- 2652US5899718AMethod for fabricating flash memory cellsUNITED SEMICONDUCTOR CORP·Filed 1997·Granted May 4, 1999·13 cites·12 claims
- 2750US5817577AGrounding method for eliminating process antenna effectUNITED MICROELECTRONICS CORP·Filed 1996·Granted Oct 6, 1998·16 cites·6 claims
- 2849US6159803AMethod of fabricating flash memoryUNITED MICROELECTRONICS CORP·Filed 1998·Granted Dec 12, 2000·11 cites·12 claims
- 2948US5654569ARetarded double diffused drain device structureUNITED MICROELECTRONICS CORP·Filed 1996·Granted Aug 5, 1997·9 cites·4 claims
- 3047US5716874AMethod of fabricating EPROM memory by individually forming gate oxide and coupling insulatorUNITED MICROELECTRONICS CORP·Filed 1996·Granted Feb 10, 1998·10 cites·10 claims
- 3144US6194271B1Method for fabricating flash memoryUNITED SEMICONDUCTOR CORP·Filed 1999·Granted Feb 27, 2001·7 cites·19 claims
- 3244US5602049AMethod of fabricating a buried structure SRAM cellUNITED MICROELECTRONICS CORP·Filed 1994·Granted Feb 11, 1997·12 cites·9 claims
- 3343US6555893B1Bar circuit for an integrated circuitUNITED MICROELECTRONICS CORP·Filed 2002·Granted Apr 29, 2003·4 cites·14 claims
- 3442US5646062AMethod for ESD protection circuit with deep source diffusionUNITED MICROELECTRONICS CORP·Filed 1995·Granted Jul 8, 1997·8 cites·3 claims
- 3539US5960288AMethod of fabricating electrostatic discharge protection deviceUNITED SEMICONDUCTOR CORP·Filed 1997·Granted Sep 28, 1999·6 cites·5 claims
- 3637US6225219B1Method of stabilizing anti-reflection coating layerUNITED MICROELECTRONICS CORP·Filed 1999·Granted May 1, 2001·7 cites·16 claims
- 3737US6046938AStructure of a flash memoryUNITED SEMICONDUCTOR CORP·Filed 1998·Granted Apr 4, 2000·5 cites·7 claims
- 3835US6046079AMethod for prevention of latch-up of CMOS devicesUNITED MICROELECTRONICS CORP·Filed 1997·Granted Apr 4, 2000·5 cites·19 claims
- 3934US2002089021A1Semiconductor device with an anti-doped regionFiled 2001·Application pending·0 cites
- 4032US6180471B1Method of fabricating high voltage semiconductor deviceUNITED SEMICONDUCTOR CORP·Filed 1998·Granted Jan 30, 2001·2 cites·12 claims
- 4131US2002182824A1Method of forming shallow trench isolationUNITED MICROELECTRONICS CORP·Filed 2001·Application pending·0 cites
- 4230US6221761B1Method of stabilizing anti-reflection coating layerUNITED MICROELECTRONICS CORP·Filed 1999·Granted Apr 24, 2001·2 cites·19 claims
- 4328US5976935AMethod of fabricating an electrically erasable and programmable read-only memory (EEPROM) with improved quality for the tunneling oxide layer thereinUNITED SEMICONDUCTOR CORP·Filed 1998·Granted Nov 2, 1999·3 cites·8 claims
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