Inventor · disambiguated record
Mitsuru Shinagawa
Also filed as: SHINAGAWA MITSURU
48 granted patents·5 pending applications·348 citations·filing 1992–2020
98Inventor score
Files withANDO ELECTRIC28NIPPON TELEGRAPH & TELEPHONE14YOKOGAWA ELECTRIC CORP3JX NIPPON MINING & METALS CORP1KAWANO RYUSUKE1
Top patents by PatentIndex Score
53 records- 0192US7493047B2Transceiver suitable for data communications between wearable computersNIPPON TELEGRAPH & TELEPHONE·Filed 2007·Granted Feb 17, 2009·17 cites·2 claims
- 0291US7583930B2Transmission device, electric field communication transceiver, and electric field communication systemNIPPON TELEGRAPH & TELEPHONE·Filed 2005·Granted Sep 1, 2009·24 cites·37 claims
- 0385US7801483B2Receiver, transceiver, and electric field communication systemNIPPON TELEGRAPH & TELEPHONE·Filed 2007·Granted Sep 21, 2010·12 cites·22 claims
- 0481US7069062B2Transceiver capable of causing series resonance with parasitic capacitanceNIPPON TELEGRAPH & TELEPHONE·Filed 2003·Granted Jun 27, 2006·26 cites·49 claims
- 0579US7430374B2Transceiver suitable for data communications between wearable computersNIPPON TELEGRAPH & TELEPHONE·Filed 2006·Granted Sep 30, 2008·7 cites·49 claims
- 0672US7907895B2Electric field sensor device, transceiver, positional information obtaining system and information input systemNIPPON TELEGRAPH & TELEPHONE·Filed 2004·Granted Mar 15, 2011·18 cites·12 claims
- 0772US7412229B2Sales apparatus and method of transmitting and receiving merchandise information by electric field induced in human bodyNIPPON TELEPHONE AND TELEGRAPH·Filed 2003·Granted Aug 12, 2008·8 cites·2 claims
- 0868US5808473AElectric signal measurement apparatus using electro-optic sampling by one point contactNIPPON TELEGRAPH & TELEPHONE·Filed 1995·Granted Sep 15, 1998·34 cites·38 claims
- 0961US7263295B2Transceiver suitable for data communications between wearable computersNIPPON TELEGRAPH & TELEPHONE·Filed 2002·Granted Aug 28, 2007·8 cites·6 claims
- 1061US6429669B1Temperature-insensitive electro-optic probeANDO ELECTRIC·Filed 2000·Granted Aug 6, 2002·10 cites·24 claims
- 1160US6166845AElectro-optic probeANDO ELECTRIC·Filed 1999·Granted Dec 26, 2000·22 cites·3 claims
- 1259US5274325AMethod and apparatus for electro-optic sampling measurement of electrical signals in integrated circuitsNIPPON TELEGRAPH & TELEPHONE·Filed 1992·Granted Dec 28, 1993·17 cites·10 claims
- 1358US6297651B1Electro-optic sampling probe having unit for adjusting quantity of light incident on electro-optic sampling optical system moduleANDO ELECTRIC·Filed 2000·Granted Oct 2, 2001·8 cites·3 claims
- 1456US7433111B2Electrooptic modulation elementNIPPON TELEGRAPH & TELEPHONE·Filed 2004·Granted Oct 7, 2008·6 cites·4 claims
- 1555US7636547B2Reactance adjuster, transceiver and transmitter using the reactance adjuster, signal processing circuit suitable for use in the reactance adjuster, the transceiver, and the transmitter, reactance adjusting method, transmitting method, and receiving methodNIPPON TELEGRAPH & TELEPHONE·Filed 2004·Granted Dec 22, 2009·4 cites·21 claims
- 1655US6445198B1Electro-optic sampling probe and a method for adjusting the sameANDO ELECTRIC·Filed 2000·Granted Sep 3, 2002·7 cites·5 claims
- 1754US6337565B1Electro-optic probeANDO ELECTRIC·Filed 2000·Granted Jan 8, 2002·5 cites·8 claims
- 1853US6567760B1Electro-optic sampling oscilloscopeANDO ELECTRIC·Filed 1999·Granted May 20, 2003·17 cites·23 claims
- 1951US6410906B1Electro-optic probeANDO ELECTRIC·Filed 2000·Granted Jun 25, 2002·5 cites·4 claims
- 2048US10641807B2Optical modulator and electric field sensorJX NIPPON MINING & METALS CORP·Filed 2016·Granted May 5, 2020·0 cites·12 claims
- 2148US6201235B1Electro-optic sampling oscilloscopeANDO ELECTRIC·Filed 1999·Granted Mar 13, 2001·14 cites·20 claims
- 2248US2008205904A1Electric Field Sensor Device, Transceiver, Positional Information Obtaining System, and Information Input SystemNIPPON TELEGRAPH & TELEPHONE·Filed 2008·Application pending·0 cites
- 2347US6384590B1Light receiving circuit for use in electro-optic sampling oscilloscopeANDO ELECTRIC·Filed 1999·Granted May 7, 2002·13 cites·3 claims
- 2446US6507014B2Electro-optic probeANDO ELECTRIC·Filed 2002·Granted Jan 14, 2003·3 cites·19 claims
- 2546US6288531B1Probe for electro-optic sampling oscilloscopeANDO ELECTRIC·Filed 2000·Granted Sep 11, 2001·3 cites·7 claims
- 2645US12174231B2Measurement device and measurement methodYOKOGAWA ELECTRIC CORP·Filed 2019·Granted Dec 24, 2024·0 cites·7 claims
- 2745US12117475B2Electric field sensorYOKOGAWA ELECTRIC CORP·Filed 2020·Granted Oct 15, 2024·0 cites·18 claims
- 2845US11885841B2Electric field sensorYOKOGAWA ELECTRIC CORP·Filed 2019·Granted Jan 30, 2024·0 cites·9 claims
- 2944US6347005B1Electro-optic sampling probeANDO ELECTRIC·Filed 2000·Granted Feb 12, 2002·3 cites·9 claims
- 3043US6624644B2Electro-optic probe and magneto-optic probeANDO ELECTRIC·Filed 2001·Granted Sep 23, 2003·2 cites·10 claims
- 3142US7859666B2Electric field sensorNIPPON TELEGRAPH & TELEPHONE·Filed 2004·Granted Dec 28, 2010·2 cites·7 claims
- 3242US6407561B1Probe for electro-optic sampling oscilloscopeANDO ELECTRIC·Filed 2000·Granted Jun 18, 2002·2 cites·6 claims
- 3341US6403946B1Electro-optic sampling probe comprising photodiodes insulated from main frame of EOS optical systemANDO ELECTRIC·Filed 2000·Granted Jun 11, 2002·1 cites·3 claims
- 3439US11876575B2Electric field communication systemNEXTY ELECTRONICS CORP·Filed 2020·Granted Jan 16, 2024·0 cites·17 claims
- 3539US6232765B1Electro-optical oscilloscope with improved samplingANDO ELECTRIC·Filed 1999·Granted May 15, 2001·8 cites·10 claims
- 3637US8666312B2Electric-field communication deviceKAWANO RYUSUKE·Filed 2008·Granted Mar 4, 2014·0 cites·19 claims
- 3736US6310507B1Timing generation circuit for electro-optic sampling oscilloscopeANDO ELECTRIC·Filed 1998·Granted Oct 30, 2001·7 cites·9 claims
- 3835US6469528B2Electro-optic sampling probe and measuring method using the sameANDO ELECTRIC·Filed 1999·Granted Oct 22, 2002·5 cites·10 claims
- 3935US6369562B2Electro-optical probe for oscilloscope measuring signal waveformANDO ELECTRIC·Filed 1999·Granted Apr 9, 2002·5 cites·6 claims
- 4034US2001022340A1Electro-optic probeFiled 2000·Application pending·0 cites
- 4134US2002017913A1Electro-optic sampling probeFiled 2001·Application pending·0 cites
- 4233US6388454B1Electro-optic sampling proberANDO ELECTRIC·Filed 1999·Granted May 14, 2002·4 cites·1 claims
- 4333US6297650B1Electrooptic probeANDO ELECTRIC·Filed 1999·Granted Oct 2, 2001·4 cites·12 claims
- 4433US5543723AApparatus for electro-optic sampling measuring of electrical signals in integrated circuits with improved probe positioning accuracyNIPPON TELEGRAPH & TELEPHONE·Filed 1993·Granted Aug 6, 1996·3 cites·16 claims
- 4532US6342783B1Electrooptic probeANDO ELECTRIC·Filed 1999·Granted Jan 29, 2002·3 cites·9 claims
- 4631US6288529B1Timing generation circuit for an electro-optic oscilloscopeANDO ELECTRIC·Filed 1999·Granted Sep 11, 2001·4 cites·2 claims
- 4731US2001022338A1Probe signal outputting apparatusFiled 2000·Application pending·0 cites
- 4831US2001022339A1Probe signal outputting apparatusFiled 2000·Application pending·0 cites
- 4930US6348787B1Electrooptic probeANDO ELECTRIC·Filed 1999·Granted Feb 19, 2002·2 cites·16 claims
- 5030US6087838ASignal processing circuit for electro-optic probeANDO ELECTRIC·Filed 1998·Granted Jul 11, 2000·2 cites·8 claims
Showing the top 50 of 53 patent records by PatentIndex Score.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →