Inventor · disambiguated record
Detlef Gerhard
Also filed as: GERHARD DETLEF
14 granted patents·3 pending applications·192 citations·filing 1989–2016
91Inventor score
Top patents by PatentIndex Score
17 records- 0187US4969037AArrangement for illuminating and detecting parts in an image processing systemSIEMENS AG·Filed 1989·Granted Nov 6, 1990·88 cites·26 claims
- 0271US6970238B2System for inspecting the surfaces of objectsICOS VISION SYSTEMS NV·Filed 2001·Granted Nov 29, 2005·11 cites·20 claims
- 0370US6039254AMethod for imaging bar codesSIEMENS AG·Filed 1994·Granted Mar 21, 2000·54 cites·14 claims
- 0467US6745637B2Self-supporting adaptable metrology deviceINFINEON TECHNOLOGIES SC300·Filed 2002·Granted Jun 8, 2004·13 cites·22 claims
- 0565US7434856B2Gripper and method of operating the sameICOS VISION SYSTEMS NV·Filed 2003·Granted Oct 14, 2008·10 cites·7 claims
- 0664US10355622B2Lifting system, method for electrical testing, vibration damper, and machine assemblySIEMENS AG·Filed 2014·Granted Jul 16, 2019·1 cites·20 claims
- 0763US7427731B2Illumination unit and method for the operation thereofICOS VISION SYSTEMS NV·Filed 2005·Granted Sep 23, 2008·3 cites·13 claims
- 0856US8183581B2LED arrangementGERHARD DETLEF·Filed 2009·Granted May 22, 2012·2 cites·20 claims
- 0956US6261382B1Wafer markingINFINEON TECHNOLOGIES AG·Filed 2000·Granted Jul 17, 2001·8 cites·4 claims
- 1054US10171009B2Apparatus and method for lifting objectsSIEMENS AG·Filed 2014·Granted Jan 1, 2019·0 cites·18 claims
- 1150US10786908B2Device for attaching to a robotSIEMENS AG·Filed 2016·Granted Sep 29, 2020·0 cites·20 claims
- 1246US7361921B2Device and method for plane-parallel orientation of a the surface of an object to be examined in relation to a focus plane of a lensICOS VISION SYSTEMS NV·Filed 2004·Granted Apr 22, 2008·2 cites·7 claims
- 1345US2008285615A1Method for Determining at Least One State Variable of an Electric Arc Furnace, and Electric Arc FurnaceFINK DIETER·Filed 2006·Application pending·0 cites
- 1444US9255303B2Method for determining at least one state variable of an electric arc furnace, and electric arc furnaceFINK DIETER·Filed 2010·Granted Feb 9, 2016·0 cites·17 claims
- 1535US2014233040A1Methods and Devices for Measuring Homogeneously Reflective SurfacesSIEMENS AG·Filed 2012·Application pending·0 cites
- 1632US2004233403A1Device and method for optically scanning a substrate diskFiled 2002·Application pending·0 cites
- 1727US6147321AConfiguration for the automatic inscription or reinscription of wafersINFINEON TECHNOLOGIES AG·Filed 1998·Granted Nov 14, 2000·0 cites·3 claims
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