Inventor · disambiguated record
Michael Moskie
Also filed as: MOSKIE MICHAEL
17 granted patents·19 citations·filing 2018–2024
90Inventor score
Files withNANOTRONICS IMAGING INC17
Top patents by PatentIndex Score
17 records- 0194US10545096B1Marco inspection systems, apparatus and methodsNANOTRONICS IMAGING INC·Filed 2019·Granted Jan 28, 2020·7 cites·6 claims
- 0293US11411293B1Fault protected signal splitter apparatusNANOTRONICS IMAGING INC·Filed 2021·Granted Aug 9, 2022·2 cites·24 claims
- 0386US10254214B1Systems, devices, and methods for combined wafer and photomask inspectionNANOTRONICS IMAGING INC·Filed 2018·Granted Apr 9, 2019·6 cites·12 claims
- 0485US10915992B1System, method and apparatus for macroscopic inspection of reflective specimensNANOTRONICS IMAGING INC·Filed 2019·Granted Feb 9, 2021·3 cites·20 claims
- 0579US11955686B2Fault protected signal splitter apparatusNANOTRONICS IMAGING INC·Filed 2023·Granted Apr 9, 2024·0 cites·20 claims
- 0677US12368223B2Fault protected signal splitter apparatusNANOTRONICS IMAGING INC·Filed 2024·Granted Jul 22, 2025·0 cites·20 claims
- 0776US11656184B2Macro inspection systems, apparatus and methodsNANOTRONICS IMAGING INC·Filed 2022·Granted May 23, 2023·0 cites·20 claims
- 0875US11784386B2Fault protected signal splitter apparatusNANOTRONICS IMAGING INC·Filed 2022·Granted Oct 10, 2023·0 cites·20 claims
- 0974US11995802B2System, method and apparatus for macroscopic inspection of reflective specimensNANOTRONICS IMAGING INC·Filed 2023·Granted May 28, 2024·0 cites·20 claims
- 1070US11663703B2System, method and apparatus for macroscopic inspection of reflective specimensNANOTRONICS IMAGING INC·Filed 2022·Granted May 30, 2023·0 cites·20 claims
- 1170US11341617B2System, method and apparatus for macroscopic inspection of reflective specimensNANOTRONICS IMAGING INC·Filed 2021·Granted May 24, 2022·0 cites·20 claims
- 1270US11125677B2Systems, devices, and methods for combined wafer and photomask inspectionNANOTRONICS IMAGING INC·Filed 2019·Granted Sep 21, 2021·1 cites·12 claims
- 1365US11894596B2Fault protected signal splitter apparatusNANOTRONICS IMAGING INC·Filed 2023·Granted Feb 6, 2024·0 cites·20 claims
- 1465US11408829B2Macro inspection systems, apparatus and methodsNANOTRONICS IMAGING INC·Filed 2021·Granted Aug 9, 2022·0 cites·20 claims
- 1564US11961210B2System, method and apparatus for macroscopic inspection of reflective specimensNANOTRONICS IMAGING INC·Filed 2023·Granted Apr 16, 2024·0 cites·20 claims
- 1662US10914686B2Macro inspection systems, apparatus and methodsNANOTRONICS IMAGING INC·Filed 2020·Granted Feb 9, 2021·0 cites·20 claims
- 1757US11593919B2System, method and apparatus for macroscopic inspection of reflective specimensNANOTRONICS IMAGING INC·Filed 2021·Granted Feb 28, 2023·0 cites·20 claims
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