Inventor · disambiguated record
Nicolas Mauricio Weiss
Also filed as: WEISS NICOLAS MAURICIO · WEISS NICOLÁS
5 granted patents·1 citations·filing 2016–2021
63Inventor score
Top patents by PatentIndex Score
5 records- 0170US10705430B2Method of measuring a parameter of interest, inspection apparatus, lithographic system and device manufacturing methodASML NETHERLANDS BV·Filed 2018·Granted Jul 7, 2020·1 cites·20 claims
- 0266US11604419B2Method of determining information about a patterning process, method of reducing error in measurement data, method of calibrating a metrology process, method of selecting metrology targetsASML NETHERLANDS BV·Filed 2021·Granted Mar 14, 2023·0 cites·20 claims
- 0361US11067381B2Common-path integrated low coherence interferometry system and method thereforACAD MEDISCH CT·Filed 2020·Granted Jul 20, 2021·0 cites·19 claims
- 0456US11022897B2Method of determining information about a patterning process, method of reducing error in measurement data, method of calibrating a metrology process, method of selecting metrology targetsASML NETHERLANDS BV·Filed 2018·Granted Jun 1, 2021·0 cites·20 claims
- 0547US10753724B2Common-path integrated low coherence interferometry system and method thereforIXA AMC OFFICE / ACAD MEDICAL CENTER·Filed 2016·Granted Aug 25, 2020·0 cites·21 claims
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