Inventor · disambiguated record
Gary Robert Waggoner
Also filed as: WAGGONER GARY ROBERT
4 granted patents·65 citations·filing 2005–2009
77Inventor score
Top patents by PatentIndex Score
4 records- 0183US8145958B2Integrated circuit and method for testing memory on the integrated circuitAITKEN ROBERT CAMPBELL·Filed 2005·Granted Mar 27, 2012·20 cites·14 claims
- 0280US8112681B2Method and apparatus for handling fuse data for repairing faulty elements within an ICKHOJA FAISAL RAMZAN ALI·Filed 2008·Granted Feb 7, 2012·28 cites·17 claims
- 0378US8045401B2Supporting scan functions within memoriesADVANCED RISC MACH LTD·Filed 2009·Granted Oct 25, 2011·11 cites·18 claims
- 0469US7734974B2Serial scan chain control within an integrated circuitADVANCED RISC MACH LTD·Filed 2007·Granted Jun 8, 2010·6 cites·13 claims
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