Inventor · disambiguated record
Jack W. Lai
Also filed as: LAI JACK · LAI JACK W · LAI JACK WING
10 granted patents·7 pending applications·451 citations·filing 1995–2017
92Inventor score
Files with3M INNOVATIVE PROPERTIES CO10UNITED MICROELECTRONICS CORP23M INNONATIVE PROPERTIES COMPA13M INNOVATION PROPERTIES COMPA1JACO INTERNAT CORP1
Top patents by PatentIndex Score
17 records- 0194US7250611B2LED curing apparatus and method3M INNOVATIVE PROPERTIES CO·Filed 2003·Granted Jul 31, 2007·89 cites·37 claims
- 0291US7189983B2LED modifying apparatus and method3M INNOVATIVE PROPERTIES CO·Filed 2004·Granted Mar 13, 2007·38 cites·23 claims
- 0390US5976199ASingle semiconductor wafer transfer method and manufacturing systemUNITED MICROELECTRONICS CORP·Filed 1997·Granted Nov 2, 1999·131 cites·13 claims
- 0485US5668056ASingle semiconductor wafer transfer method and manufacturing systemUNITED MICROELECTRONICS CORP·Filed 1995·Granted Sep 16, 1997·92 cites·8 claims
- 0584US7202490B2LED modifying apparatus and method3M INNOVATIVE PROPERTIES CO·Filed 2004·Granted Apr 10, 2007·22 cites·29 claims
- 0682US10746660B2Cure monitoring systems and methods3M INNOVATIVE PROPERTIES CO·Filed 2017·Granted Aug 18, 2020·2 cites·22 claims
- 0777US6252237B1Low cost thickness measurement method and apparatus for thin coatings3M INNOVATION PROPERTIES COMPA·Filed 1998·Granted Jun 26, 2001·47 cites·6 claims
- 0873US7202489B2LED modifying apparatus and method3M INNOVATIVE PROPERTIES CO·Filed 2004·Granted Apr 10, 2007·15 cites·14 claims
- 0973US7113282B2Multiplexing rotary spectrometer3M INNONATIVE PROPERTIES COMPA·Filed 2003·Granted Sep 26, 2006·15 cites·44 claims
- 1067US8460754B2Needle coating and in-line curing of a coated workpieceNELSON JAMES M·Filed 2009·Granted Jun 11, 2013·0 cites·20 claims
- 1151US2007023306A1Hex wrench storage deviceJACO INTERNAT CORP·Filed 2005·Application pending·0 cites
- 1246US2013243972A1Needle coating and in-line curing of a coated workpiece3M INNOVATIVE PROPERTIES CO·Filed 2013·Application pending·0 cites
- 1345US2014362371A1Sensor for measuring surface non-uniformity3M INNOVATIVE PROPERTIES CO·Filed 2012·Application pending·0 cites
- 1445US2015009301A1Method and apparatus for measuring the three dimensional structure of a surface3M INNOVATIVE PROPERTIES CO·Filed 2013·Application pending·0 cites
- 1543US2014240720A1Linewidth measurement system3M INNOVATIVE PROPERTIES CO·Filed 2012·Application pending·0 cites
- 1639US2019336259A1Dental curing light systems and methods3M INNOVATIVE PROPERTIES CO·Filed 2017·Application pending·0 cites
- 1733US2013113919A1High resolution autofocus inspection systemQIAO YI·Filed 2011·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →