Inventor · disambiguated record

Jonathan R. Skuza

Also filed as: SKUZA JONATHAN R

1 granted patent·4 citations·filing 2014–2014

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Technology areasG01N

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1 record

0181US9835570B2X-ray diffraction (XRD) characterization methods for sigma=3 twin defects in cubic semiconductor (100) wafersNASA·Filed 2014·Granted Dec 5, 2017·4 cites·18 claims

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Jonathan R. Skuza — Patent Inventor | PatentIndex