Inventor · disambiguated record
Yi-Liang Liu
Also filed as: LIU YI-LIANG
9 granted patents·4 pending applications·20 citations·filing 2013–2017
82Inventor score
Files withUNITED MICROELECTRONICS CORP13
Top patents by PatentIndex Score
13 records- 0189US9773682B1Method of planarizing substrate surfaceUNITED MICROELECTRONICS CORP·Filed 2016·Granted Sep 26, 2017·5 cites·7 claims
- 0286US9147612B2Method for forming a semiconductor structureUNITED MICROELECTRONICS CORP·Filed 2013·Granted Sep 29, 2015·7 cites·9 claims
- 0384US9905430B1Method for forming semiconductor structureUNITED MICROELECTRONICS CORP·Filed 2016·Granted Feb 27, 2018·4 cites·16 claims
- 0481US9875909B1Method for planarizing material layerUNITED MICROELECTRONICS CORP·Filed 2016·Granted Jan 23, 2018·3 cites·18 claims
- 0564US9093465B2Method of fabricating semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2013·Granted Jul 28, 2015·1 cites·11 claims
- 0658US10103034B2Method of planarizing substrate surfaceUNITED MICROELECTRONICS CORP·Filed 2017·Granted Oct 16, 2018·0 cites·6 claims
- 0758US10049887B2Method of planarizing substrate surfaceUNITED MICROELECTRONICS CORP·Filed 2017·Granted Aug 14, 2018·0 cites·7 claims
- 0848US9299600B2Method for repairing an oxide layer and method for manufacturing a semiconductor structure applying the sameUNITED MICROELECTRONICS CORP·Filed 2014·Granted Mar 29, 2016·0 cites·16 claims
- 0943US2015214114A1Manufacturing method of semiconductor structureUNITED MICROELECTRONICS CORP·Filed 2014·Application pending·0 cites
- 1043US2015140819A1Semiconductor processUNITED MICROELECTRONICS CORP·Filed 2013·Application pending·0 cites
- 1140US9972498B2Method of fabricating a gate cap layerUNITED MICROELECTRONICS CORP·Filed 2016·Granted May 15, 2018·0 cites·13 claims
- 1236US2018033636A1Method of fabricating a semiconductor structureUNITED MICROELECTRONICS CORP·Filed 2016·Application pending·0 cites
- 1334US2017162402A1Method of manufacturing a semiconductor structureUNITED MICROELECTRONICS CORP·Filed 2015·Application pending·0 cites
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