Inventor · disambiguated record
Nobukazu Oba
Also filed as: OBA NOBUKAZU
11 granted patents·1 pending application·411 citations·filing 1997–2015
92Inventor score
Top patents by PatentIndex Score
12 records- 0198US6422088B1Sensor failure or abnormality detecting system incorporated in a physical or dynamic quantity detecting apparatusDENSO CORP·Filed 2000·Granted Jul 23, 2002·142 cites·64 claims
- 0291US6389903B1Pressure-detecting device coupling member with interchangeable connector partDENSO CORP·Filed 1999·Granted May 21, 2002·83 cites·24 claims
- 0389US6343498B1Physical quantity sensor having fault detection functionDENSO CORP·Filed 2000·Granted Feb 5, 2002·40 cites·14 claims
- 0483US5761957ASemiconductor pressure sensor that suppresses non-linear temperature characteristicsDENSO CORP·Filed 1997·Granted Jun 9, 1998·53 cites·5 claims
- 0579US6401018B1Sensor device having malfunction detectorDENSO CORP·Filed 2000·Granted Jun 4, 2002·24 cites·7 claims
- 0676US5986316ASemiconductor type physical quantity sensorDENSO CORP·Filed 1997·Granted Nov 16, 1999·49 cites·31 claims
- 0762US9868629B2Semiconductor deviceDENSO CORP·Filed 2015·Granted Jan 16, 2018·1 cites·15 claims
- 0858US8008948B2Peak voltage detector circuit and binarizing circuit including the same circuitDENSO CORP·Filed 2007·Granted Aug 30, 2011·3 cites·10 claims
- 0950US8130115B2Signal processing circuit for rotation detecting deviceKURUMADO NORIHIRO·Filed 2009·Granted Mar 6, 2012·1 cites·15 claims
- 1048US5932921ASensor chip having a diode portions and a thin-wall portionDENSO CORP·Filed 1997·Granted Aug 3, 1999·11 cites·15 claims
- 1136US2009002033A1Noise removal circuit and comparator circuit including sameDENSO CORP·Filed 2008·Application pending·0 cites
- 1234US5920106ASemiconductor device and method for producing the sameDENSO CORP·Filed 1997·Granted Jul 6, 1999·4 cites·19 claims
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