Inventor · disambiguated record

To Dieu Liang

Also filed as: LIANG TO DIEU

1 granted patent·16 citations·filing 2006–2006

37Inventor score

Technology areasH04L

Files withIBM1

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1 record

0177US7650555B2Method and apparatus for characterizing components of a device under test using on-chip trace logic analyzerIBM·Filed 2006·Granted Jan 19, 2010·16 cites·14 claims

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