Inventor · disambiguated record
David J. Heine
Also filed as: HEINE DAVID J
7 granted patents·230 citations·filing 1996–2014
87Inventor score
Top patents by PatentIndex Score
7 records- 0188US5804249AMultistep tungsten CVD process with amorphization stepLSI LOGIC CORP·Filed 1997·Granted Sep 8, 1998·117 cites·18 claims
- 0287US7904278B2Methods and system for program execution integrity measurementUNIV JOHNS HOPKINS·Filed 2007·Granted Mar 8, 2011·31 cites·4 claims
- 0372US9507945B2Method and apparatus for automated vulnerability detectionUNIV JOHNS HOPKINS·Filed 2014·Granted Nov 29, 2016·5 cites·20 claims
- 0468US6066561AApparatus and method for electrical determination of delamination at one or more interfaces within a semiconductor waferLSI LOGIC CORP·Filed 1997·Granted May 23, 2000·39 cites·14 claims
- 0567US8326579B2Method and system for program execution integrity measurementWILSON PERRY W·Filed 2011·Granted Dec 4, 2012·4 cites·3 claims
- 0657US5769692AOn the use of non-spherical carriers for substrate chemi-mechanical polishingLSI LOGIC CORP·Filed 1996·Granted Jun 23, 1998·23 cites·23 claims
- 0743US6016009AIntegrated circuit with tungsten plug containing amorphization layerLSI LOGIC CORP·Filed 1998·Granted Jan 18, 2000·11 cites·24 claims
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