Inventor · disambiguated record
Robert Madge
Also filed as: MADGE ROBERT · MADGE ROBERT J
17 granted patents·2 pending applications·324 citations·filing 1988–2011
94Inventor score
Top patents by PatentIndex Score
19 records- 0194US6807655B1Adaptive off tester screening method based on intrinsic die parametric measurementsLSI LOGIC CORP·Filed 2002·Granted Oct 19, 2004·107 cites·18 claims
- 0282US6598194B1Test limits based on positionLSI LOGIC CORP·Filed 2000·Granted Jul 22, 2003·31 cites·20 claims
- 0379US4905230AToken ring expander and/or hubMADGE NETWORKS LTD·Filed 1988·Granted Feb 27, 1990·62 cites·7 claims
- 0478US6943042B2Method of detecting spatially correlated variations in a parameter of an integrated circuit dieLSI LOGIC CORP·Filed 2003·Granted Sep 13, 2005·19 cites·7 claims
- 0577US6601008B1Parametric device signatureLSI LOGIC CORP·Filed 2001·Granted Jul 29, 2003·21 cites·20 claims
- 0676US6787379B1Method of detecting spatially correlated variations in a parameter of an integrated circuit dieLSI LOGIC CORP·Filed 2001·Granted Sep 7, 2004·17 cites·3 claims
- 0761US6931297B1Feature targeted inspectionLSI LOGIC CORP·Filed 2004·Granted Aug 16, 2005·6 cites·17 claims
- 0857US6476631B1Defect screening using delta VDDLSI LOGIC CORP·Filed 2001·Granted Nov 5, 2002·8 cites·20 claims
- 0956US6682947B1Feed forward testingLSI LOGIC CORP·Filed 2002·Granted Jan 27, 2004·7 cites·20 claims
- 1055US6647348B2Latent defect classification systemLSI LOGIC CORP·Filed 2001·Granted Nov 11, 2003·7 cites·20 claims
- 1154US6782500B1Statistical decision systemLSI LOGIC CORP·Filed 2000·Granted Aug 24, 2004·7 cites·20 claims
- 1252US6624048B1Die attach back grindingLSI LOGIC CORP·Filed 2001·Granted Sep 23, 2003·3 cites·19 claims
- 1351US4985888AToken ring system hierarchyMADGE NETWORKS LTD·Filed 1989·Granted Jan 15, 1991·16 cites·3 claims
- 1448US7079963B2Modified binary search for optimizing efficiency of data collection timeLSI LOGIC CORP·Filed 2003·Granted Jul 18, 2006·3 cites·20 claims
- 1548US7073107B2Adaptive defect based testingLSI LOGIC CORP·Filed 2003·Granted Jul 4, 2006·7 cites·16 claims
- 1646US6532431B1Ratio testingLSI LOGIC CORP·Filed 2002·Granted Mar 11, 2003·3 cites·20 claims
- 1740US7305634B2Method to selectively identify at risk die based on location within the reticleLSI CORP·Filed 2004·Granted Dec 4, 2007·0 cites·16 claims
- 1839US2013154109A1Method of lowering capacitances of conductive apertures and an interposer capable of being reverse biased to achieve reduced capacitanceVENKATRAMAN RAMNATH·Filed 2011·Application pending·0 cites
- 1935US2004236531A1Method for adaptively testing integrated circuits based on parametric fabrication dataFiled 2003·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →